Application of system modeling for production system of portable products considering variation in leakage current characteristics of semiconductors
Thermal design of electronic products has become increasingly complicated with leakage current characteristics and their variation of semiconductors. This paper proposes an application of a thermal system model to a production system of electronic products. The thermal system model is developed for...
| Main Authors: | , , |
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| Format: | Article |
| Language: | Japanese |
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The Japan Society of Mechanical Engineers
2016-03-01
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| Series: | Nihon Kikai Gakkai ronbunshu |
| Subjects: | |
| Online Access: | https://www.jstage.jst.go.jp/article/transjsme/82/835/82_15-00480/_pdf/-char/en |
| _version_ | 1811221150079909888 |
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| author | Yoshio MURAOKA Kenichi SEKI Hidekazu NISHIMURA |
| author_facet | Yoshio MURAOKA Kenichi SEKI Hidekazu NISHIMURA |
| author_sort | Yoshio MURAOKA |
| collection | DOAJ |
| description | Thermal design of electronic products has become increasingly complicated with leakage current characteristics and their variation of semiconductors. This paper proposes an application of a thermal system model to a production system of electronic products. The thermal system model is developed for architecture design to determine design parameters of modules. The model is described with Systems Modeling Language (SysML) considering interactions among parameters of mechanical structure and electrical components that include semiconductors with temperature-dependent leakage current characteristics. In the system model, constraints of heat generation and heat transfer are described using equations and relation between equations and parameters are clarified in parametric diagram. The system model that is developed at the early stage of product design is used at the beginning of integration, such as receiving inspection. To prevent quality degradation by variation in component characteristics, semiconductor components such as processing units are screened with thermal simulation result before their implementation on Printed Wiring Board (PWB). The simulation result is being referred to temperatures that cause low-temperature burn injury. As a case study, a system model of portable product is developed and demonstrates thermal simulation to determine limitation in large variation in leakage current characteristics to satisfy product thermal quality. To improve yield ratio of the semiconductor components after screening, system models are developed for various products in which same processing units are installed. The system model can be applied for each product changing the design parameters and simulate to determine allowable range of component characteristics keeping the product quality. Implementing a component that causes more leakage effect into a product that has more allowable range, degradation of product quality can be avoid without losing the component yield ratio. |
| first_indexed | 2024-04-12T07:54:22Z |
| format | Article |
| id | doaj.art-4f594b3f4ea84ea0a1d0b89019ec8363 |
| institution | Directory Open Access Journal |
| issn | 2187-9761 |
| language | Japanese |
| last_indexed | 2024-04-12T07:54:22Z |
| publishDate | 2016-03-01 |
| publisher | The Japan Society of Mechanical Engineers |
| record_format | Article |
| series | Nihon Kikai Gakkai ronbunshu |
| spelling | doaj.art-4f594b3f4ea84ea0a1d0b89019ec83632022-12-22T03:41:31ZjpnThe Japan Society of Mechanical EngineersNihon Kikai Gakkai ronbunshu2187-97612016-03-018283515-0048015-0048010.1299/transjsme.15-00480transjsmeApplication of system modeling for production system of portable products considering variation in leakage current characteristics of semiconductorsYoshio MURAOKA0Kenichi SEKI1Hidekazu NISHIMURA2SDM Research Institute, Keio UniversitySDM Research Institute, Keio UniversityGraduate School of System Design and Management, Keio UniversityThermal design of electronic products has become increasingly complicated with leakage current characteristics and their variation of semiconductors. This paper proposes an application of a thermal system model to a production system of electronic products. The thermal system model is developed for architecture design to determine design parameters of modules. The model is described with Systems Modeling Language (SysML) considering interactions among parameters of mechanical structure and electrical components that include semiconductors with temperature-dependent leakage current characteristics. In the system model, constraints of heat generation and heat transfer are described using equations and relation between equations and parameters are clarified in parametric diagram. The system model that is developed at the early stage of product design is used at the beginning of integration, such as receiving inspection. To prevent quality degradation by variation in component characteristics, semiconductor components such as processing units are screened with thermal simulation result before their implementation on Printed Wiring Board (PWB). The simulation result is being referred to temperatures that cause low-temperature burn injury. As a case study, a system model of portable product is developed and demonstrates thermal simulation to determine limitation in large variation in leakage current characteristics to satisfy product thermal quality. To improve yield ratio of the semiconductor components after screening, system models are developed for various products in which same processing units are installed. The system model can be applied for each product changing the design parameters and simulate to determine allowable range of component characteristics keeping the product quality. Implementing a component that causes more leakage effect into a product that has more allowable range, degradation of product quality can be avoid without losing the component yield ratio.https://www.jstage.jst.go.jp/article/transjsme/82/835/82_15-00480/_pdf/-char/ensystem modelv-modelthermal designsimulationsysmlelectronics productsleakage currentlow temperature injurly |
| spellingShingle | Yoshio MURAOKA Kenichi SEKI Hidekazu NISHIMURA Application of system modeling for production system of portable products considering variation in leakage current characteristics of semiconductors Nihon Kikai Gakkai ronbunshu system model v-model thermal design simulation sysml electronics products leakage current low temperature injurly |
| title | Application of system modeling for production system of portable products considering variation in leakage current characteristics of semiconductors |
| title_full | Application of system modeling for production system of portable products considering variation in leakage current characteristics of semiconductors |
| title_fullStr | Application of system modeling for production system of portable products considering variation in leakage current characteristics of semiconductors |
| title_full_unstemmed | Application of system modeling for production system of portable products considering variation in leakage current characteristics of semiconductors |
| title_short | Application of system modeling for production system of portable products considering variation in leakage current characteristics of semiconductors |
| title_sort | application of system modeling for production system of portable products considering variation in leakage current characteristics of semiconductors |
| topic | system model v-model thermal design simulation sysml electronics products leakage current low temperature injurly |
| url | https://www.jstage.jst.go.jp/article/transjsme/82/835/82_15-00480/_pdf/-char/en |
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