Effect of Annealing on the Magnetic Properties of Co<sub>2</sub>MnSi-Based Heusler Alloy Glass-Coated Microwires

In the current study, we concentrated on the influence of annealing on the magnetic behavior of Co<sub>2</sub>MnSi-based Heusler microwires. We set the annealing temperature at 1023 K for 2 h, as the sample did not show any significant changes in the magnetic properties at lower temperat...

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Bibliographic Details
Main Authors: Mohamed Salaheldeen, Mihail Ipatov, Paula Corte-Leon, Valentina Zhukova, Arcady Zhukov
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Metals
Subjects:
Online Access:https://www.mdpi.com/2075-4701/13/2/412
Description
Summary:In the current study, we concentrated on the influence of annealing on the magnetic behavior of Co<sub>2</sub>MnSi-based Heusler microwires. We set the annealing temperature at 1023 K for 2 h, as the sample did not show any significant changes in the magnetic properties at lower temperatures, while annealing at temperatures above 1023 K damages the glass coating. Strong in-plane magnetocrystalline anisotropy parallel to the microwire axis was evident in the magnetic behavior at room temperature for as-prepared and annealed samples. The coercivity of the annealed sample was four times higher than that of the as-prepared sample across a wide range of measuring temperatures. Both annealed and as-prepared samples exhibit quite stable coercivity behavior with temperature, which may have interesting applications. The an nealed sample did not exhibit magnetic saturation for M-H loops measured below 50 K. Sharp irreversible magnetic behavior has been detected for annealed samples at a blocking temperature of 220 K; at the same time, the blocking temperature for the as-prepared sample was 150 K. The strong internal mechanical stress induced during the fabrication of Co<sub>2</sub>MnSi microwires in addition to the internal stress relaxation caused by the annealing induced the onset of magnetic phases resulting in unusual and irreversible magnetic behavior.
ISSN:2075-4701