Local Phase Segregation Induced by Ion Milling in 2:17-Type Sm-Co Based Magnets

Transmission electron microscopy (TEM) is indispensable to reveal the cellular nanostructure of the 2:17-type Sm-Co based magnets which act as the first choice for high-temperature magnet-associated devices. However, structural deficiencies could be introduced into the TEM specimen during the ion mi...

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Main Authors: Xin Song, Yao Liu, Wentao Jia, Jian Li, Xiaolian Liu, Lizhong Zhao, Tao Yuan, Tianyu Ma
Format: Article
Language:English
Published: MDPI AG 2023-06-01
Series:Materials
Subjects:
Online Access:https://www.mdpi.com/1996-1944/16/12/4378
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author Xin Song
Yao Liu
Wentao Jia
Jian Li
Xiaolian Liu
Lizhong Zhao
Tao Yuan
Tianyu Ma
author_facet Xin Song
Yao Liu
Wentao Jia
Jian Li
Xiaolian Liu
Lizhong Zhao
Tao Yuan
Tianyu Ma
author_sort Xin Song
collection DOAJ
description Transmission electron microscopy (TEM) is indispensable to reveal the cellular nanostructure of the 2:17-type Sm-Co based magnets which act as the first choice for high-temperature magnet-associated devices. However, structural deficiencies could be introduced into the TEM specimen during the ion milling process, which would provide misleading information to understand the microstructure–property relationship of such magnets. In this work, we performed a comparative investigation of the microstructure and microchemistry between two TEM specimens prepared under different ion milling conditions in a model commercial magnet Sm<sub>13</sub>Gd<sub>12</sub>Co<sub>50</sub>Cu<sub>8.5</sub>Fe<sub>13</sub>Zr<sub>3.5</sub> (wt.%). It is found that additional low-energy ion milling will preferably damage the 1:5H cell boundaries, while having no influence on the 2:17R cell phase. The structure of cell boundary transforms from hexagonal into face-centered-cubic. In addition, the elemental distribution within the damaged cell boundaries becomes discontinuous, segregating into Sm/Gd-rich and Fe/Co/Cu-rich portions. Our study suggested that in order to reveal the true microstructure of the Sm-Co based magnets, the TEM specimen should be carefully prepared to avoid structural damage and artificial deficiencies.
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spelling doaj.art-5036b197cac14dd79c1bea41380eefaa2023-11-18T11:25:25ZengMDPI AGMaterials1996-19442023-06-011612437810.3390/ma16124378Local Phase Segregation Induced by Ion Milling in 2:17-Type Sm-Co Based MagnetsXin Song0Yao Liu1Wentao Jia2Jian Li3Xiaolian Liu4Lizhong Zhao5Tao Yuan6Tianyu Ma7Frontier Institute of Science and Technology and State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, ChinaFrontier Institute of Science and Technology and State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, ChinaFrontier Institute of Science and Technology and State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, ChinaFrontier Institute of Science and Technology and State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, ChinaCollege of Materials and Environmental Engineering, Hangzhou Dianzi University, Hangzhou 310018, ChinaCollege of Materials and Environmental Engineering, Hangzhou Dianzi University, Hangzhou 310018, ChinaFrontier Institute of Science and Technology and State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, ChinaFrontier Institute of Science and Technology and State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, ChinaTransmission electron microscopy (TEM) is indispensable to reveal the cellular nanostructure of the 2:17-type Sm-Co based magnets which act as the first choice for high-temperature magnet-associated devices. However, structural deficiencies could be introduced into the TEM specimen during the ion milling process, which would provide misleading information to understand the microstructure–property relationship of such magnets. In this work, we performed a comparative investigation of the microstructure and microchemistry between two TEM specimens prepared under different ion milling conditions in a model commercial magnet Sm<sub>13</sub>Gd<sub>12</sub>Co<sub>50</sub>Cu<sub>8.5</sub>Fe<sub>13</sub>Zr<sub>3.5</sub> (wt.%). It is found that additional low-energy ion milling will preferably damage the 1:5H cell boundaries, while having no influence on the 2:17R cell phase. The structure of cell boundary transforms from hexagonal into face-centered-cubic. In addition, the elemental distribution within the damaged cell boundaries becomes discontinuous, segregating into Sm/Gd-rich and Fe/Co/Cu-rich portions. Our study suggested that in order to reveal the true microstructure of the Sm-Co based magnets, the TEM specimen should be carefully prepared to avoid structural damage and artificial deficiencies.https://www.mdpi.com/1996-1944/16/12/4378Sm-Co magnetsion millingphase segregationTEM
spellingShingle Xin Song
Yao Liu
Wentao Jia
Jian Li
Xiaolian Liu
Lizhong Zhao
Tao Yuan
Tianyu Ma
Local Phase Segregation Induced by Ion Milling in 2:17-Type Sm-Co Based Magnets
Materials
Sm-Co magnets
ion milling
phase segregation
TEM
title Local Phase Segregation Induced by Ion Milling in 2:17-Type Sm-Co Based Magnets
title_full Local Phase Segregation Induced by Ion Milling in 2:17-Type Sm-Co Based Magnets
title_fullStr Local Phase Segregation Induced by Ion Milling in 2:17-Type Sm-Co Based Magnets
title_full_unstemmed Local Phase Segregation Induced by Ion Milling in 2:17-Type Sm-Co Based Magnets
title_short Local Phase Segregation Induced by Ion Milling in 2:17-Type Sm-Co Based Magnets
title_sort local phase segregation induced by ion milling in 2 17 type sm co based magnets
topic Sm-Co magnets
ion milling
phase segregation
TEM
url https://www.mdpi.com/1996-1944/16/12/4378
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