Abnormal shadow contrast imaging for optimal objective lens condition in transmission electron microscope

Abnormal shadow contrast imaging for optimal objective lens condition in transmission electron microscope

Abstract Background In a transmission electron microscope (TEM), the objective lens (OL) is the most important component because the first image and diffraction pattern for a specimen are formed by applying a specific OL current and specimen height (SH). In TEM, the focal length of the OL should be...

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Bibliographic Details
Main Authors: Yong-Eun Kwon, Cheolsu Han, Sang-Chul Lee, Jong-Man Jeung, Gaehang Lee, Tae-Yeoung Lee, Jin-Gyu Kim
Format: Article
Language:English
Published: SpringerOpen 2022-05-01
Series:Journal of Analytical Science and Technology
Subjects:
TEM
Abnormal contrast imaging
Standard objective lens
Specimen height
Shadow contrast
Online Access:https://doi.org/10.1186/s40543-022-00323-8

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