Temperature-Dependent X-ray Diffraction Measurements of Infrared Superlattices Grown by MBE
Strained-layer superlattices (SLSs) are an active research topic in the molecular beam epitaxy (MBE) and infrared focal plane array communities. These structures undergo a >500 K temperature change between deposition and operation. As a result, the lattice constants of the substrate and super...
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| Format: | Article |
| Language: | English |
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MDPI AG
2016-11-01
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| Series: | Crystals |
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| Online Access: | http://www.mdpi.com/2073-4352/6/11/150 |
| _version_ | 1817990337955627008 |
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| author | Charles J. Reyner Arnold M. Kiefer Gamini Ariyawansa Joshua M. Duran John E. Scheihing |
| author_facet | Charles J. Reyner Arnold M. Kiefer Gamini Ariyawansa Joshua M. Duran John E. Scheihing |
| author_sort | Charles J. Reyner |
| collection | DOAJ |
| description | Strained-layer superlattices (SLSs) are an active research topic in the molecular beam epitaxy (MBE) and infrared focal plane array communities. These structures undergo a >500 K temperature change between deposition and operation. As a result, the lattice constants of the substrate and superlattice are expected to change by approximately 0.3%, and at approximately the same rate. However, we present the first temperature-dependent X-ray diffraction (XRD) measurements of SLS material on GaSb and show that the superlattice does not contract in the same manner as the substrate. In both InAs/InAs0.65Sb0.35 and In0.8Ga0.2As/InAs0.65Sb0.35 SLS structures, the apparent out-of-plane strain states of the superlattices switch from tensile at deposition to compressive at operation. These changes have ramifications for material characterization, defect generation, carrier lifetime, and overall device performance of superlattices grown by MBE. |
| first_indexed | 2024-04-14T00:58:11Z |
| format | Article |
| id | doaj.art-50a364b93cf549469639ad0a763ae9e8 |
| institution | Directory Open Access Journal |
| issn | 2073-4352 |
| language | English |
| last_indexed | 2024-04-14T00:58:11Z |
| publishDate | 2016-11-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Crystals |
| spelling | doaj.art-50a364b93cf549469639ad0a763ae9e82022-12-22T02:21:31ZengMDPI AGCrystals2073-43522016-11-0161115010.3390/cryst6110150cryst6110150Temperature-Dependent X-ray Diffraction Measurements of Infrared Superlattices Grown by MBECharles J. Reyner0Arnold M. Kiefer1Gamini Ariyawansa2Joshua M. Duran3John E. Scheihing4Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USAAir Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USAAir Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USAAir Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USAAir Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USAStrained-layer superlattices (SLSs) are an active research topic in the molecular beam epitaxy (MBE) and infrared focal plane array communities. These structures undergo a >500 K temperature change between deposition and operation. As a result, the lattice constants of the substrate and superlattice are expected to change by approximately 0.3%, and at approximately the same rate. However, we present the first temperature-dependent X-ray diffraction (XRD) measurements of SLS material on GaSb and show that the superlattice does not contract in the same manner as the substrate. In both InAs/InAs0.65Sb0.35 and In0.8Ga0.2As/InAs0.65Sb0.35 SLS structures, the apparent out-of-plane strain states of the superlattices switch from tensile at deposition to compressive at operation. These changes have ramifications for material characterization, defect generation, carrier lifetime, and overall device performance of superlattices grown by MBE.http://www.mdpi.com/2073-4352/6/11/150Type-II superlatticeMWIRinfrared detectorsInAs/InAsSbInGaAs/InAsSbXRDtemperature dependence |
| spellingShingle | Charles J. Reyner Arnold M. Kiefer Gamini Ariyawansa Joshua M. Duran John E. Scheihing Temperature-Dependent X-ray Diffraction Measurements of Infrared Superlattices Grown by MBE Crystals Type-II superlattice MWIR infrared detectors InAs/InAsSb InGaAs/InAsSb XRD temperature dependence |
| title | Temperature-Dependent X-ray Diffraction Measurements of Infrared Superlattices Grown by MBE |
| title_full | Temperature-Dependent X-ray Diffraction Measurements of Infrared Superlattices Grown by MBE |
| title_fullStr | Temperature-Dependent X-ray Diffraction Measurements of Infrared Superlattices Grown by MBE |
| title_full_unstemmed | Temperature-Dependent X-ray Diffraction Measurements of Infrared Superlattices Grown by MBE |
| title_short | Temperature-Dependent X-ray Diffraction Measurements of Infrared Superlattices Grown by MBE |
| title_sort | temperature dependent x ray diffraction measurements of infrared superlattices grown by mbe |
| topic | Type-II superlattice MWIR infrared detectors InAs/InAsSb InGaAs/InAsSb XRD temperature dependence |
| url | http://www.mdpi.com/2073-4352/6/11/150 |
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