CAN-Based Aging Monitoring Technique for Automotive ASICs With Efficient Soft Error Resilience
The modern automobile industry is rapidly shifting toward the era of self-driving cars. Due to rapid technological development, many mechanical parts in automobiles have been switched to electronic devices. Therefore, the proportion of electronic devices in modern cars is increasing. Even though man...
Main Authors: | Jinuk Kim, Muhammad Ibtesam, Dooyoung Kim, Jihun Jung, Sungju Park |
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Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/8968344/ |
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