InGaN Laser Diodes with Etched Facets for Photonic Integrated Circuit Applications

The main objective of this work is to demonstrate and validate the feasibility of fabricating (Al, In) GaN laser diodes with etched facets. The facets are fabricated using a two-step dry and wet etching process: inductively coupled plasma—reactive ion etching in chlorine, followed by wet etching in...

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Main Authors: Krzysztof Gibasiewicz, Anna Kafar, Dario Schiavon, Kiran Saba, Łucja Marona, Eliana Kamińska, Piotr Perlin
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Micromachines
Subjects:
Online Access:https://www.mdpi.com/2072-666X/14/2/408
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author Krzysztof Gibasiewicz
Anna Kafar
Dario Schiavon
Kiran Saba
Łucja Marona
Eliana Kamińska
Piotr Perlin
author_facet Krzysztof Gibasiewicz
Anna Kafar
Dario Schiavon
Kiran Saba
Łucja Marona
Eliana Kamińska
Piotr Perlin
author_sort Krzysztof Gibasiewicz
collection DOAJ
description The main objective of this work is to demonstrate and validate the feasibility of fabricating (Al, In) GaN laser diodes with etched facets. The facets are fabricated using a two-step dry and wet etching process: inductively coupled plasma—reactive ion etching in chlorine, followed by wet etching in tetramethylammonium hydroxide (TMAH). For the dry etching stage, an optimized procedure was used. For the wet etching step, the TMAH temperature was set to a constant value of 80 °C, and the only variable parameter was time. The time was divided into individual steps, each of 20 min. To validate the results, electro-optical parameters were measured after each step and compared with a cleaved reference, as well as with scanning electron microscope imaging of the front surface. It was determined that the optimal wet etching time was 40 min. For this time, the laser tested achieved a fully comparable threshold current (within 10%) with the cleaved reference. The described technology is an important step for the future manufacturing of photonic integrated circuits with laser diodes integrated on a chip and for ultra-short-cavity lasers.
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spelling doaj.art-5100f264e4f54e0393103b22eb4ed70c2023-11-16T22:11:49ZengMDPI AGMicromachines2072-666X2023-02-0114240810.3390/mi14020408InGaN Laser Diodes with Etched Facets for Photonic Integrated Circuit ApplicationsKrzysztof Gibasiewicz0Anna Kafar1Dario Schiavon2Kiran Saba3Łucja Marona4Eliana Kamińska5Piotr Perlin6Institute of High Pressure Physics, Polish Academy of Sciences, Sokolowska 29/37, 01-142 Warsaw, PolandInstitute of High Pressure Physics, Polish Academy of Sciences, Sokolowska 29/37, 01-142 Warsaw, PolandInstitute of High Pressure Physics, Polish Academy of Sciences, Sokolowska 29/37, 01-142 Warsaw, PolandInstitute of High Pressure Physics, Polish Academy of Sciences, Sokolowska 29/37, 01-142 Warsaw, PolandInstitute of High Pressure Physics, Polish Academy of Sciences, Sokolowska 29/37, 01-142 Warsaw, PolandInstitute of High Pressure Physics, Polish Academy of Sciences, Sokolowska 29/37, 01-142 Warsaw, PolandInstitute of High Pressure Physics, Polish Academy of Sciences, Sokolowska 29/37, 01-142 Warsaw, PolandThe main objective of this work is to demonstrate and validate the feasibility of fabricating (Al, In) GaN laser diodes with etched facets. The facets are fabricated using a two-step dry and wet etching process: inductively coupled plasma—reactive ion etching in chlorine, followed by wet etching in tetramethylammonium hydroxide (TMAH). For the dry etching stage, an optimized procedure was used. For the wet etching step, the TMAH temperature was set to a constant value of 80 °C, and the only variable parameter was time. The time was divided into individual steps, each of 20 min. To validate the results, electro-optical parameters were measured after each step and compared with a cleaved reference, as well as with scanning electron microscope imaging of the front surface. It was determined that the optimal wet etching time was 40 min. For this time, the laser tested achieved a fully comparable threshold current (within 10%) with the cleaved reference. The described technology is an important step for the future manufacturing of photonic integrated circuits with laser diodes integrated on a chip and for ultra-short-cavity lasers.https://www.mdpi.com/2072-666X/14/2/408InGaN laserFabry–Perotwet etching GaNGaN TMAH
spellingShingle Krzysztof Gibasiewicz
Anna Kafar
Dario Schiavon
Kiran Saba
Łucja Marona
Eliana Kamińska
Piotr Perlin
InGaN Laser Diodes with Etched Facets for Photonic Integrated Circuit Applications
Micromachines
InGaN laser
Fabry–Perot
wet etching GaN
GaN TMAH
title InGaN Laser Diodes with Etched Facets for Photonic Integrated Circuit Applications
title_full InGaN Laser Diodes with Etched Facets for Photonic Integrated Circuit Applications
title_fullStr InGaN Laser Diodes with Etched Facets for Photonic Integrated Circuit Applications
title_full_unstemmed InGaN Laser Diodes with Etched Facets for Photonic Integrated Circuit Applications
title_short InGaN Laser Diodes with Etched Facets for Photonic Integrated Circuit Applications
title_sort ingan laser diodes with etched facets for photonic integrated circuit applications
topic InGaN laser
Fabry–Perot
wet etching GaN
GaN TMAH
url https://www.mdpi.com/2072-666X/14/2/408
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AT darioschiavon inganlaserdiodeswithetchedfacetsforphotonicintegratedcircuitapplications
AT kiransaba inganlaserdiodeswithetchedfacetsforphotonicintegratedcircuitapplications
AT łucjamarona inganlaserdiodeswithetchedfacetsforphotonicintegratedcircuitapplications
AT elianakaminska inganlaserdiodeswithetchedfacetsforphotonicintegratedcircuitapplications
AT piotrperlin inganlaserdiodeswithetchedfacetsforphotonicintegratedcircuitapplications