Analyzing the Bolometric Performance of Vanadium Oxide Thin Films Modified by Carbon Nanotube Dispersions
The influence of carbon nanotube (CNT) dispersions on the electrical properties and noise signal amplitude of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O&l...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2023-02-01
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| Series: | Materials |
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| Online Access: | https://www.mdpi.com/1996-1944/16/4/1534 |
| _version_ | 1797619603314049024 |
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| author | Usha Philipose Chris Littler Yan Jiang Alia Naciri Michael Harcrow A. J. Syllaios |
| author_facet | Usha Philipose Chris Littler Yan Jiang Alia Naciri Michael Harcrow A. J. Syllaios |
| author_sort | Usha Philipose |
| collection | DOAJ |
| description | The influence of carbon nanotube (CNT) dispersions on the electrical properties and noise signal amplitude of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> films is investigated. For a critical range of the CNT dispersion density on <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> films, the intrinsic properties of the <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> films are modified by the CNTs. The CNT concentrations reported in this work are about 0.3 <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi mathvariant="sans-serif">μ</mi></semantics></math></inline-formula>g/cm<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mrow></mrow><mn>2</mn></msup></semantics></math></inline-formula> and 1.6 <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi mathvariant="sans-serif">μ</mi></semantics></math></inline-formula>g/cm<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mrow></mrow><mn>2</mn></msup></semantics></math></inline-formula>, allowing for low density and high density dispersions on the <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> film surface to be investigated. These values are higher than the percolation threshold of about 0.12 <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi mathvariant="sans-serif">μ</mi></semantics></math></inline-formula>g/cm<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mrow></mrow><mn>2</mn></msup></semantics></math></inline-formula> for these films. The composite film exhibits a significant reduction in the temperature coefficient of resistance (TCR) (from ≈3.8% <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mi>K</mi><mrow><mo>−</mo><mn>1</mn></mrow></msup></semantics></math></inline-formula> to ≈0.3% <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mi>K</mi><mrow><mo>−</mo><mn>1</mn></mrow></msup></semantics></math></inline-formula>) for high density dispersions. In contrast, while <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula>–CNT composites with low density single wall CNT dispersions exhibit no significant change in TCR values, an approximate two orders of magnitude reduction in the low frequency 1/f noise is measured. The noise signal amplitude measured at 0.1 V and at 1.0 Hz reduces from 6 × <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mn>10</mn><mrow><mo>−</mo><mn>5</mn></mrow></msup></semantics></math></inline-formula><inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><mo>/</mo><msqrt><mo>(</mo></msqrt><mrow><mi>H</mi><mi>z</mi><mo>)</mo></mrow></mrow></semantics></math></inline-formula> for <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> films to 5 × <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mn>10</mn><mrow><mo>−</mo><mn>7</mn></mrow></msup></semantics></math></inline-formula><inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><mo>/</mo><msqrt><mo>(</mo></msqrt><mrow><mi>H</mi><mi>z</mi><mo>)</mo></mrow></mrow></semantics></math></inline-formula> for the low density SWCNT dispersion on <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> film and to 3 × <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mn>10</mn><mrow><mo>−</mo><mn>6</mn></mrow></msup></semantics></math></inline-formula><inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><mo>/</mo><msqrt><mo>(</mo></msqrt><mrow><mi>H</mi><mi>z</mi><mo>)</mo></mrow></mrow></semantics></math></inline-formula> for the low density MWCNT dispersion on <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> film. The CNT concentration is the critical factor for yielding the observed changes in conductivity and low frequency noise. The results presented in this work provide a better understanding of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula>-based composites, thereby enabling the development of new, versatile and functional materials for device applications. |
| first_indexed | 2024-03-11T08:29:20Z |
| format | Article |
| id | doaj.art-51987506f5b548d08446c99e4e521332 |
| institution | Directory Open Access Journal |
| issn | 1996-1944 |
| language | English |
| last_indexed | 2024-03-11T08:29:20Z |
| publishDate | 2023-02-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Materials |
| spelling | doaj.art-51987506f5b548d08446c99e4e5213322023-11-16T21:51:06ZengMDPI AGMaterials1996-19442023-02-01164153410.3390/ma16041534Analyzing the Bolometric Performance of Vanadium Oxide Thin Films Modified by Carbon Nanotube DispersionsUsha Philipose0Chris Littler1Yan Jiang2Alia Naciri3Michael Harcrow4A. J. Syllaios5Department of Physics, University of North Texas, Denton, TX 76203, USADepartment of Physics, University of North Texas, Denton, TX 76203, USADepartment of Physics, University of North Texas, Denton, TX 76203, USADepartment of Physics, University of North Texas, Denton, TX 76203, USADepartment of Physics, University of North Texas, Denton, TX 76203, USADepartment of Physics, University of North Texas, Denton, TX 76203, USAThe influence of carbon nanotube (CNT) dispersions on the electrical properties and noise signal amplitude of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> films is investigated. For a critical range of the CNT dispersion density on <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> films, the intrinsic properties of the <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> films are modified by the CNTs. The CNT concentrations reported in this work are about 0.3 <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi mathvariant="sans-serif">μ</mi></semantics></math></inline-formula>g/cm<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mrow></mrow><mn>2</mn></msup></semantics></math></inline-formula> and 1.6 <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi mathvariant="sans-serif">μ</mi></semantics></math></inline-formula>g/cm<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mrow></mrow><mn>2</mn></msup></semantics></math></inline-formula>, allowing for low density and high density dispersions on the <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> film surface to be investigated. These values are higher than the percolation threshold of about 0.12 <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi mathvariant="sans-serif">μ</mi></semantics></math></inline-formula>g/cm<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mrow></mrow><mn>2</mn></msup></semantics></math></inline-formula> for these films. The composite film exhibits a significant reduction in the temperature coefficient of resistance (TCR) (from ≈3.8% <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mi>K</mi><mrow><mo>−</mo><mn>1</mn></mrow></msup></semantics></math></inline-formula> to ≈0.3% <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mi>K</mi><mrow><mo>−</mo><mn>1</mn></mrow></msup></semantics></math></inline-formula>) for high density dispersions. In contrast, while <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula>–CNT composites with low density single wall CNT dispersions exhibit no significant change in TCR values, an approximate two orders of magnitude reduction in the low frequency 1/f noise is measured. The noise signal amplitude measured at 0.1 V and at 1.0 Hz reduces from 6 × <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mn>10</mn><mrow><mo>−</mo><mn>5</mn></mrow></msup></semantics></math></inline-formula><inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><mo>/</mo><msqrt><mo>(</mo></msqrt><mrow><mi>H</mi><mi>z</mi><mo>)</mo></mrow></mrow></semantics></math></inline-formula> for <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> films to 5 × <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mn>10</mn><mrow><mo>−</mo><mn>7</mn></mrow></msup></semantics></math></inline-formula><inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><mo>/</mo><msqrt><mo>(</mo></msqrt><mrow><mi>H</mi><mi>z</mi><mo>)</mo></mrow></mrow></semantics></math></inline-formula> for the low density SWCNT dispersion on <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> film and to 3 × <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msup><mn>10</mn><mrow><mo>−</mo><mn>6</mn></mrow></msup></semantics></math></inline-formula><inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><mo>/</mo><msqrt><mo>(</mo></msqrt><mrow><mi>H</mi><mi>z</mi><mo>)</mo></mrow></mrow></semantics></math></inline-formula> for the low density MWCNT dispersion on <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula> film. The CNT concentration is the critical factor for yielding the observed changes in conductivity and low frequency noise. The results presented in this work provide a better understanding of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>V</mi><msub><mi>O</mi><mi>x</mi></msub></mrow></semantics></math></inline-formula>-based composites, thereby enabling the development of new, versatile and functional materials for device applications.https://www.mdpi.com/1996-1944/16/4/1534vanadium oxidecarbon nanotubesnoisedispersion densitytemperature coefficient of resistancebolometers |
| spellingShingle | Usha Philipose Chris Littler Yan Jiang Alia Naciri Michael Harcrow A. J. Syllaios Analyzing the Bolometric Performance of Vanadium Oxide Thin Films Modified by Carbon Nanotube Dispersions Materials vanadium oxide carbon nanotubes noise dispersion density temperature coefficient of resistance bolometers |
| title | Analyzing the Bolometric Performance of Vanadium Oxide Thin Films Modified by Carbon Nanotube Dispersions |
| title_full | Analyzing the Bolometric Performance of Vanadium Oxide Thin Films Modified by Carbon Nanotube Dispersions |
| title_fullStr | Analyzing the Bolometric Performance of Vanadium Oxide Thin Films Modified by Carbon Nanotube Dispersions |
| title_full_unstemmed | Analyzing the Bolometric Performance of Vanadium Oxide Thin Films Modified by Carbon Nanotube Dispersions |
| title_short | Analyzing the Bolometric Performance of Vanadium Oxide Thin Films Modified by Carbon Nanotube Dispersions |
| title_sort | analyzing the bolometric performance of vanadium oxide thin films modified by carbon nanotube dispersions |
| topic | vanadium oxide carbon nanotubes noise dispersion density temperature coefficient of resistance bolometers |
| url | https://www.mdpi.com/1996-1944/16/4/1534 |
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