Echelle Grating Spectroscopic Technology for High-Resolution and Broadband Spectral Measurement

Echelle grating provides high spectral resolving power and diffraction efficiency in a broadband wavelength range by the Littrow mode. The spectrometer with the cross-dispersed echelle scheme has seen remarkable growth in recent decades. Rather than the conventional approach with common blazed grati...

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Bibliographic Details
Main Authors: Yinxin Zhang, Wanzhuo Li, Wenhao Duan, Zhanhua Huang, Huaidong Yang
Format: Article
Language:English
Published: MDPI AG 2022-10-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/12/21/11042
Description
Summary:Echelle grating provides high spectral resolving power and diffraction efficiency in a broadband wavelength range by the Littrow mode. The spectrometer with the cross-dispersed echelle scheme has seen remarkable growth in recent decades. Rather than the conventional approach with common blazed grating, the cross-dispersed echelle scheme achieves the two-dimensional spatial distribution of the spectrum by one exposure without scanning in the broadband spectral range. It is the fastest and most sensitive spectroscopic technology as of now, and it has been extensively applied in commercial and astronomical spectrometers. In this review, we first highlight the characteristics of the echelle and then present the optical layout, detection approach, and method of calibration. Finally, we discuss the state-of-the-art implementations and applications of commercial and astronomical instruments.
ISSN:2076-3417