A Dynamic Range Enhanced Readout Technique with a Two-Step TDC for High Speed Linear CMOS Image Sensors

A Dynamic Range Enhanced Readout Technique with a Two-Step TDC for High Speed Linear CMOS Image Sensors

This paper presents a dynamic range (DR) enhanced readout technique with a two-step time-to-digital converter (TDC) for high speed linear CMOS image sensors. A multi-capacitor and self-regulated capacitive trans-impedance amplifier (CTIA) structure is employed to extend the dynamic range. The gain...

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Bibliographic Details
Main Authors: Zhiyuan Gao, Congjie Yang, Jiangtao Xu, Kaiming Nie
Format: Article
Language:English
Published: MDPI AG 2015-11-01
Series:Sensors
Subjects:
CMOS image sensor
CTIA
wide dynamic range
two-step TDC
error calibration
Online Access:http://www.mdpi.com/1424-8220/15/11/28224

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