Characterization of damage morphology of structural SiO2 film induced by nanosecond pulsed laser

We investigated the damage morphology of porous silicon oxide film with a periodic hexagonal hole array irradiated by nanosecond pulsed laser, both experimentally and numerically. To understand the damage morphology, the temperature field distribution and the thermal stress distribution during the l...

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Bibliographic Details
Main Authors: Li Yuan, Su Junhong, Xu Junqi, Yang Guoliang
Format: Article
Language:English
Published: De Gruyter 2022-07-01
Series:Open Physics
Subjects:
Online Access:https://doi.org/10.1515/phys-2022-0060