Nanostructure NiO films prepared by PLD and their optoelectronic properties

Nanostructure NiO films prepared by PLD and their optoelectronic properties

NiO thin films have compounded by pulsed laser deposition on glass and silicon (111) substrates, employing Q-switching Nd:YAG laser. Structure, grain size and optical properties have analyzed by using FTIR, AFM and UV-VIS spectroscopy. FTIR spectra conformed of NiO bonding. AFM images show the parti...

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Bibliographic Details
Main Authors:	Doaa Jbaier, Jehan Simon, Khawla Khashan
Format:	Article
Language:	English
Published:	Unviversity of Technology- Iraq 2015-06-01
Series:	Engineering and Technology Journal
Subjects:	nio thin film photodetector characterization of nio
Online Access:	https://etj.uotechnology.edu.iq/article_108909_1dddfcbbb5139eaa2df54d9030f16224.pdf

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