Parametric Fault Diagnosis of Analog Circuits Based on a Semi-Supervised Algorithm

Parametric Fault Diagnosis of Analog Circuits Based on a Semi-Supervised Algorithm

The parametric fault diagnosis of analog circuits is very crucial for condition-based maintenance (CBM) in prognosis and health management. In order to improve the diagnostic rate of parametric faults in engineering applications, a semi-supervised machine learning algorithm was used to classify the...

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Bibliographic Details
Main Authors:	Ling Wang, Dongfang Zhou, Hui Tian, Hao Zhang, Wei Zhang
Format:	Article
Language:	English
Published:	MDPI AG 2019-02-01
Series:	Symmetry
Subjects:	fault diagnosis lifting wavelet local preserving projection Fisher linear discriminant analysis semi-supervised random forest
Online Access:	https://www.mdpi.com/2073-8994/11/2/228

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