Smart revolution and metrology: A longitudinal science mapping approach

The aim of this study is two-fold. Firstly, it attempts to identify and visualize evolutionary pathways and scientific roadmaps focusing on the interplay between smart manufacturing and metrology as a research field. Secondly, it seeks to identify and visualize technological trends in this research...

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Main Authors: M.C. Sousa, M.F.L. Almeida
Format: Article
Language:English
Published: Elsevier 2021-12-01
Series:Measurement: Sensors
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2665917421003032
_version_ 1818388118137470976
author M.C. Sousa
M.F.L. Almeida
author_facet M.C. Sousa
M.F.L. Almeida
author_sort M.C. Sousa
collection DOAJ
description The aim of this study is two-fold. Firstly, it attempts to identify and visualize evolutionary pathways and scientific roadmaps focusing on the interplay between smart manufacturing and metrology as a research field. Secondly, it seeks to identify and visualize technological trends in this research field, i.e., the most productive themes, relevant thematic networks, and strategic diagrams based on the most cited articles in each theme for different time slices. A bibliometric analysis was conducted to assess all peer-reviewed documents indexed in the Web of Science database covering the focused research field over the 2010–2020 time frame. Based on a bibliographic data collection of 396 documents, it was possible to identify and visualize a longitudinal science map over this period, highlighting digital technology trends and identifying shifts in the boundaries of the focused emerging digital technologies applied to metrology and vice-versa, by revealing their interactions and convergence.
first_indexed 2024-12-14T04:20:45Z
format Article
id doaj.art-54de2361c06a4df68ac8f7d1ffffb259
institution Directory Open Access Journal
issn 2665-9174
language English
last_indexed 2024-12-14T04:20:45Z
publishDate 2021-12-01
publisher Elsevier
record_format Article
series Measurement: Sensors
spelling doaj.art-54de2361c06a4df68ac8f7d1ffffb2592022-12-21T23:17:22ZengElsevierMeasurement: Sensors2665-91742021-12-0118100340Smart revolution and metrology: A longitudinal science mapping approachM.C. Sousa0M.F.L. Almeida1Corresponding author.; Pontifical Catholic University of Rio de Janeiro - PUC-Rio, Rio de Janeiro, BrazilPontifical Catholic University of Rio de Janeiro - PUC-Rio, Rio de Janeiro, BrazilThe aim of this study is two-fold. Firstly, it attempts to identify and visualize evolutionary pathways and scientific roadmaps focusing on the interplay between smart manufacturing and metrology as a research field. Secondly, it seeks to identify and visualize technological trends in this research field, i.e., the most productive themes, relevant thematic networks, and strategic diagrams based on the most cited articles in each theme for different time slices. A bibliometric analysis was conducted to assess all peer-reviewed documents indexed in the Web of Science database covering the focused research field over the 2010–2020 time frame. Based on a bibliographic data collection of 396 documents, it was possible to identify and visualize a longitudinal science map over this period, highlighting digital technology trends and identifying shifts in the boundaries of the focused emerging digital technologies applied to metrology and vice-versa, by revealing their interactions and convergence.http://www.sciencedirect.com/science/article/pii/S2665917421003032MetrologyScience mappingBibliometric analysisSmart manufacturingEmerging digital technologies
spellingShingle M.C. Sousa
M.F.L. Almeida
Smart revolution and metrology: A longitudinal science mapping approach
Measurement: Sensors
Metrology
Science mapping
Bibliometric analysis
Smart manufacturing
Emerging digital technologies
title Smart revolution and metrology: A longitudinal science mapping approach
title_full Smart revolution and metrology: A longitudinal science mapping approach
title_fullStr Smart revolution and metrology: A longitudinal science mapping approach
title_full_unstemmed Smart revolution and metrology: A longitudinal science mapping approach
title_short Smart revolution and metrology: A longitudinal science mapping approach
title_sort smart revolution and metrology a longitudinal science mapping approach
topic Metrology
Science mapping
Bibliometric analysis
Smart manufacturing
Emerging digital technologies
url http://www.sciencedirect.com/science/article/pii/S2665917421003032
work_keys_str_mv AT mcsousa smartrevolutionandmetrologyalongitudinalsciencemappingapproach
AT mflalmeida smartrevolutionandmetrologyalongitudinalsciencemappingapproach