On the Influence of Metal Deposition on Responsivity Peak of Cleaned Silicon Photodetector

Abstract In the present work , p - type Si wafer of ( 111 ) orientation and 3 0.cm resistivity had been doped with phosphor by thermal diffusion process to fabricate p - n junction detector . The main optoelectronic properties of the fabricated detectors were studied . Thin films of ultrapure Cu , B...

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Main Authors: Raid Ismail, Khalid Al - Ta'ai, Manaf Ismail
Format: Article
Language:English
Published: Unviversity of Technology- Iraq 2005-03-01
Series:Engineering and Technology Journal
Subjects:
Online Access:https://etj.uotechnology.edu.iq/article_181715_d0f1adaa145d3d3cd6e64ee83c31864c.pdf
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author Raid Ismail
Khalid Al - Ta'ai
Manaf Ismail
author_facet Raid Ismail
Khalid Al - Ta'ai
Manaf Ismail
author_sort Raid Ismail
collection DOAJ
description Abstract In the present work , p - type Si wafer of ( 111 ) orientation and 3 0.cm resistivity had been doped with phosphor by thermal diffusion process to fabricate p - n junction detector . The main optoelectronic properties of the fabricated detectors were studied . Thin films of ultrapure Cu , Bi , Ag , and Al were deposited on the sensitive area of the detectors ( donor side ) . On the base of the transmission and absorption phenomena of the deposited films , peak response data of these detectors that conventionally at near IR ( 850-900 nm ) before deposition was reduced and resulted in peak response at 600 ± 25 nm after deposition .
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spelling doaj.art-55bb6232ca0348d6924105febbfa21e22024-02-04T17:56:11ZengUnviversity of Technology- IraqEngineering and Technology Journal1681-69002412-07582005-03-0124324525110.30684/etj.24.3A.5181715On the Influence of Metal Deposition on Responsivity Peak of Cleaned Silicon PhotodetectorRaid Ismail0Khalid Al - Ta'ai1Manaf Ismail2Dep. of Applied science University of Technology-IRAQ.Dep. of Applied science University of Technology Baghdad-IRAQ.Dep. of Applied science University of Technology Baghdad-IRAQ.Abstract In the present work , p - type Si wafer of ( 111 ) orientation and 3 0.cm resistivity had been doped with phosphor by thermal diffusion process to fabricate p - n junction detector . The main optoelectronic properties of the fabricated detectors were studied . Thin films of ultrapure Cu , Bi , Ag , and Al were deposited on the sensitive area of the detectors ( donor side ) . On the base of the transmission and absorption phenomena of the deposited films , peak response data of these detectors that conventionally at near IR ( 850-900 nm ) before deposition was reduced and resulted in peak response at 600 ± 25 nm after deposition .https://etj.uotechnology.edu.iq/article_181715_d0f1adaa145d3d3cd6e64ee83c31864c.pdfkeywords : metals / p - nsithermal evaporationoptoelectronic properties
spellingShingle Raid Ismail
Khalid Al - Ta'ai
Manaf Ismail
On the Influence of Metal Deposition on Responsivity Peak of Cleaned Silicon Photodetector
Engineering and Technology Journal
keywords : metals / p - nsi
thermal evaporation
optoelectronic properties
title On the Influence of Metal Deposition on Responsivity Peak of Cleaned Silicon Photodetector
title_full On the Influence of Metal Deposition on Responsivity Peak of Cleaned Silicon Photodetector
title_fullStr On the Influence of Metal Deposition on Responsivity Peak of Cleaned Silicon Photodetector
title_full_unstemmed On the Influence of Metal Deposition on Responsivity Peak of Cleaned Silicon Photodetector
title_short On the Influence of Metal Deposition on Responsivity Peak of Cleaned Silicon Photodetector
title_sort on the influence of metal deposition on responsivity peak of cleaned silicon photodetector
topic keywords : metals / p - nsi
thermal evaporation
optoelectronic properties
url https://etj.uotechnology.edu.iq/article_181715_d0f1adaa145d3d3cd6e64ee83c31864c.pdf
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