Machine vision inspection of early failure and line-shaped defects of blue InGaN/GaN light emitting diodes soaked in liquid nitrogen for cryogenic tests

Machine vision inspection of early failure and line-shaped defects of blue InGaN/GaN light emitting diodes soaked in liquid nitrogen for cryogenic tests

Cryogenic tests were conducted on blue InGaN/GaN light-emitting diodes (LEDs) by immersing the device in liquid nitrogen (LN2). To study the degradation of the LEDs, a combination of optical, electrical, and material characterizations were performed on the LN2-soaked device. The results indicate tha...

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Bibliographic Details
Main Authors: Chun-Yen Yang, Chih-Yuan Yu, You-Li Lin, Mou-Tuong Hon, Shao-Jui Yang, Yi-Zong Zhang, Hsuan-Chia Kang, Yaw-Wen Kuo, Chia-Feng Lin, You-Lin Wu, Hsin-Hung Chou, Hsiang Chen, Yung-Hui Li, Jung Han
Format: Article
Language:English
Published: Elsevier 2023-07-01
Series:Results in Physics
Subjects:
InGaN/GaN blue LED
Liquid nitrogen
Machine vision
Line defects
Lattice deformation
Online Access:http://www.sciencedirect.com/science/article/pii/S221137972300387X

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