Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time

Abstract Noninvasive X-ray imaging of nanoscale three-dimensional objects, such as integrated circuits (ICs), generally requires two types of scanning: ptychographic, which is translational and returns estimates of the complex electromagnetic field through the IC; combined with a tomographic scan, w...

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Main Authors: Iksung Kang, Ziling Wu, Yi Jiang, Yudong Yao, Junjing Deng, Jeffrey Klug, Stefan Vogt, George Barbastathis
Format: Article
Language:English
Published: Nature Publishing Group 2023-05-01
Series:Light: Science & Applications
Online Access:https://doi.org/10.1038/s41377-023-01181-8
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author Iksung Kang
Ziling Wu
Yi Jiang
Yudong Yao
Junjing Deng
Jeffrey Klug
Stefan Vogt
George Barbastathis
author_facet Iksung Kang
Ziling Wu
Yi Jiang
Yudong Yao
Junjing Deng
Jeffrey Klug
Stefan Vogt
George Barbastathis
author_sort Iksung Kang
collection DOAJ
description Abstract Noninvasive X-ray imaging of nanoscale three-dimensional objects, such as integrated circuits (ICs), generally requires two types of scanning: ptychographic, which is translational and returns estimates of the complex electromagnetic field through the IC; combined with a tomographic scan, which collects these complex field projections from multiple angles. Here, we present Attentional Ptycho-Tomography (APT), an approach to drastically reduce the amount of angular scanning, and thus the total acquisition time. APT is machine learning-based, utilizing axial self-Attention for Ptycho-Tomographic reconstruction. APT is trained to obtain accurate reconstructions of the ICs, despite the incompleteness of the measurements. The training process includes regularizing priors in the form of typical patterns found in IC interiors, and the physics of X-ray propagation through the IC. We show that APT with ×12 reduced angles achieves fidelity comparable to the gold standard Simultaneous Algebraic Reconstruction Technique (SART) with the original set of angles. When using the same set of reduced angles, then APT also outperforms Filtered Back Projection (FBP), Simultaneous Iterative Reconstruction Technique (SIRT) and SART. The time needed to compute the reconstruction is also reduced, because the trained neural network is a forward operation, unlike the iterative nature of these alternatives. Our experiments show that, without loss in quality, for a 4.48 × 93.2 × 3.92 µm3 IC (≃6 × 108 voxels), APT reduces the total data acquisition and computation time from 67.96 h to 38 min. We expect our physics-assisted and attention-utilizing machine learning framework to be applicable to other branches of nanoscale imaging, including materials science and biological imaging.
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spelling doaj.art-55ea2e92ba8a4e1bb6f4bf7f7ec8b1d32023-06-04T11:38:53ZengNature Publishing GroupLight: Science & Applications2047-75382023-05-0112111410.1038/s41377-023-01181-8Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation timeIksung Kang0Ziling Wu1Yi Jiang2Yudong Yao3Junjing Deng4Jeffrey Klug5Stefan Vogt6George Barbastathis7Department of Electrical Engineering and Computer Science, Massachusetts Institute of TechnologyDepartment of Mechanical Engineering, Massachusetts Institute of TechnologyArgonne National LaboratoryArgonne National LaboratoryArgonne National LaboratoryArgonne National LaboratoryArgonne National LaboratoryDepartment of Mechanical Engineering, Massachusetts Institute of TechnologyAbstract Noninvasive X-ray imaging of nanoscale three-dimensional objects, such as integrated circuits (ICs), generally requires two types of scanning: ptychographic, which is translational and returns estimates of the complex electromagnetic field through the IC; combined with a tomographic scan, which collects these complex field projections from multiple angles. Here, we present Attentional Ptycho-Tomography (APT), an approach to drastically reduce the amount of angular scanning, and thus the total acquisition time. APT is machine learning-based, utilizing axial self-Attention for Ptycho-Tomographic reconstruction. APT is trained to obtain accurate reconstructions of the ICs, despite the incompleteness of the measurements. The training process includes regularizing priors in the form of typical patterns found in IC interiors, and the physics of X-ray propagation through the IC. We show that APT with ×12 reduced angles achieves fidelity comparable to the gold standard Simultaneous Algebraic Reconstruction Technique (SART) with the original set of angles. When using the same set of reduced angles, then APT also outperforms Filtered Back Projection (FBP), Simultaneous Iterative Reconstruction Technique (SIRT) and SART. The time needed to compute the reconstruction is also reduced, because the trained neural network is a forward operation, unlike the iterative nature of these alternatives. Our experiments show that, without loss in quality, for a 4.48 × 93.2 × 3.92 µm3 IC (≃6 × 108 voxels), APT reduces the total data acquisition and computation time from 67.96 h to 38 min. We expect our physics-assisted and attention-utilizing machine learning framework to be applicable to other branches of nanoscale imaging, including materials science and biological imaging.https://doi.org/10.1038/s41377-023-01181-8
spellingShingle Iksung Kang
Ziling Wu
Yi Jiang
Yudong Yao
Junjing Deng
Jeffrey Klug
Stefan Vogt
George Barbastathis
Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time
Light: Science & Applications
title Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time
title_full Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time
title_fullStr Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time
title_full_unstemmed Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time
title_short Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time
title_sort attentional ptycho tomography apt for three dimensional nanoscale x ray imaging with minimal data acquisition and computation time
url https://doi.org/10.1038/s41377-023-01181-8
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