The Coefficient of the Voltage Induced Frequency Shift Measurement on a Quartz Tuning Fork

We have measured the coefficient of the voltage induced frequency shift (VIFS) of a 32.768 KHz quartz tuning fork. Three vibration modes were studied: one prong oscillating, two prongs oscillating in the same direction, and two prongs oscillating in opposite directions. They all showed a parabolic d...

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Bibliographic Details
Main Authors: Yubin Hou, Qingyou Lu
Format: Article
Language:English
Published: MDPI AG 2014-11-01
Series:Sensors
Subjects:
Online Access:http://www.mdpi.com/1424-8220/14/11/21941
Description
Summary:We have measured the coefficient of the voltage induced frequency shift (VIFS) of a 32.768 KHz quartz tuning fork. Three vibration modes were studied: one prong oscillating, two prongs oscillating in the same direction, and two prongs oscillating in opposite directions. They all showed a parabolic dependence of the eigen-frequency shift on the bias voltage applied across the fork, due to the voltage-induced internal stress, which varies as the fork oscillates. The average coefficient of the VIFS effect is as low as several hundred nano-Hz per millivolt, implying that fast-response voltage-controlled oscillators and phase-locked loops with nano-Hz resolution can be built.
ISSN:1424-8220