Applying Deep Learning to Construct a Defect Detection System for Ceramic Substrates

Under the emerging topic of machine vision technology replacing manual examination, automatic optical inspection (AOI) technology has been adopted for the detection of defects in semi-finished/finished products and is widely used for the defect detection of printed circuit boards (PCB) in electronic...

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Bibliographic Details
Main Authors: Chien-Yi Huang, I-Chen Lin, Yuan-Lien Liu
Format: Article
Language:English
Published: MDPI AG 2022-02-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/12/5/2269