XCT and DLW: Synergies of Two Techniques at Sub-Micrometer Resolution
Direct Laser Writing (DLW) and X-ray computed tomography (XCT) both offer unique possibilities in their respective fields. DLW produces full three-dimensional (3D) polymer structures on the microscale with resolutions below 100 nm. The fabricated structures can be analysed by XCT or X-ray microscopy...
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| Format: | Article |
| Language: | English |
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MDPI AG
2022-10-01
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| Series: | Applied Sciences |
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| Online Access: | https://www.mdpi.com/2076-3417/12/20/10488 |
| _version_ | 1827651797599125504 |
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| author | Sven Fritzsche Gerd-Rüdiger Jaenisch Lina Pavasarytė Alexander Funk |
| author_facet | Sven Fritzsche Gerd-Rüdiger Jaenisch Lina Pavasarytė Alexander Funk |
| author_sort | Sven Fritzsche |
| collection | DOAJ |
| description | Direct Laser Writing (DLW) and X-ray computed tomography (XCT) both offer unique possibilities in their respective fields. DLW produces full three-dimensional (3D) polymer structures on the microscale with resolutions below 100 nm. The fabricated structures can be analysed by XCT or X-ray microscopy (XRM), which incorporates additional X-ray lenses, in three dimensions down to a minimal basic spatial resolution of about 500 nm or 50 nm, respectively. In this work, two different DLW structures are analysed via XCT. Internal defects are detected and analysed for the purpose of quality control. Defects and structures with sizes down to 1.5 µm are successfully analysed. A 3D reconstruction and internal, hidden features of the fabricated structures are shown and discussed. In a first-of-its-kind study, we demonstrate the detectability of a single-voxel line inside a fabricated structure that would not be detectable with SEM or light microscopy. Furthermore, the direct fabrication on a PET substrate is shown to overcome the high X-ray absorbance of commonly used glass substrates. Attenuation spectra of SZ2080 and glass substrates are compared to a fabrication route direct on a 170 µm PET foil. The practical aspects of XCT measurements for DLW structures on different substrates will be discussed. |
| first_indexed | 2024-03-09T20:46:36Z |
| format | Article |
| id | doaj.art-569fd5e61c2540f4b5812ae072109e54 |
| institution | Directory Open Access Journal |
| issn | 2076-3417 |
| language | English |
| last_indexed | 2024-03-09T20:46:36Z |
| publishDate | 2022-10-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Applied Sciences |
| spelling | doaj.art-569fd5e61c2540f4b5812ae072109e542023-11-23T22:45:32ZengMDPI AGApplied Sciences2076-34172022-10-0112201048810.3390/app122010488XCT and DLW: Synergies of Two Techniques at Sub-Micrometer ResolutionSven Fritzsche0Gerd-Rüdiger Jaenisch1Lina Pavasarytė2Alexander Funk3Bundesanstalt für Materialforschung und -prüfung, 12205 Berlin, GermanyBundesanstalt für Materialforschung und -prüfung, 12205 Berlin, GermanyBundesanstalt für Materialforschung und -prüfung, 12205 Berlin, GermanyBundesanstalt für Materialforschung und -prüfung, 12205 Berlin, GermanyDirect Laser Writing (DLW) and X-ray computed tomography (XCT) both offer unique possibilities in their respective fields. DLW produces full three-dimensional (3D) polymer structures on the microscale with resolutions below 100 nm. The fabricated structures can be analysed by XCT or X-ray microscopy (XRM), which incorporates additional X-ray lenses, in three dimensions down to a minimal basic spatial resolution of about 500 nm or 50 nm, respectively. In this work, two different DLW structures are analysed via XCT. Internal defects are detected and analysed for the purpose of quality control. Defects and structures with sizes down to 1.5 µm are successfully analysed. A 3D reconstruction and internal, hidden features of the fabricated structures are shown and discussed. In a first-of-its-kind study, we demonstrate the detectability of a single-voxel line inside a fabricated structure that would not be detectable with SEM or light microscopy. Furthermore, the direct fabrication on a PET substrate is shown to overcome the high X-ray absorbance of commonly used glass substrates. Attenuation spectra of SZ2080 and glass substrates are compared to a fabrication route direct on a 170 µm PET foil. The practical aspects of XCT measurements for DLW structures on different substrates will be discussed.https://www.mdpi.com/2076-3417/12/20/10488two-photon polymerizationX-ray microscopyXCT2PPdirect laser writingnon-destructive testing |
| spellingShingle | Sven Fritzsche Gerd-Rüdiger Jaenisch Lina Pavasarytė Alexander Funk XCT and DLW: Synergies of Two Techniques at Sub-Micrometer Resolution Applied Sciences two-photon polymerization X-ray microscopy XCT 2PP direct laser writing non-destructive testing |
| title | XCT and DLW: Synergies of Two Techniques at Sub-Micrometer Resolution |
| title_full | XCT and DLW: Synergies of Two Techniques at Sub-Micrometer Resolution |
| title_fullStr | XCT and DLW: Synergies of Two Techniques at Sub-Micrometer Resolution |
| title_full_unstemmed | XCT and DLW: Synergies of Two Techniques at Sub-Micrometer Resolution |
| title_short | XCT and DLW: Synergies of Two Techniques at Sub-Micrometer Resolution |
| title_sort | xct and dlw synergies of two techniques at sub micrometer resolution |
| topic | two-photon polymerization X-ray microscopy XCT 2PP direct laser writing non-destructive testing |
| url | https://www.mdpi.com/2076-3417/12/20/10488 |
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