Atomic Layer Deposited Hf0.5Zr0.5O2-based Flexible Memristor with Short/Long-Term Synaptic Plasticity
Abstract Artificial synapses are the fundamental of building a neuron network for neuromorphic computing to overcome the bottleneck of the von Neumann system. Based on a low-temperature atomic layer deposition process, a flexible electrical synapse was proposed and showed bipolar resistive switching...
Main Authors: | Tian-Yu Wang, Jia-Lin Meng, Zhen-Yu He, Lin Chen, Hao Zhu, Qing-Qing Sun, Shi-Jin Ding, David Wei Zhang |
---|---|
Format: | Article |
Language: | English |
Published: |
SpringerOpen
2019-03-01
|
Series: | Nanoscale Research Letters |
Subjects: | |
Online Access: | http://link.springer.com/article/10.1186/s11671-019-2933-y |
Similar Items
-
A flexible Hf0.5Zr0.5O2 thin film with highly robust ferroelectricity
by: Xiang Zhou, et al.
Published: (2024-01-01) -
Controlling Resistance Switching Performances of Hf0.5Zr0.5O2 Films by Substrate Stress and Potential in Neuromorphic Computing
by: Zuoao Xiao, et al.
Published: (2022-08-01) -
A Comparative Study on the Ferroelectric Performances in Atomic Layer Deposited Hf0.5Zr0.5O2 Thin Films Using Tetrakis(ethylmethylamino) and Tetrakis(dimethylamino) Precursors
by: Baek Su Kim, et al.
Published: (2020-04-01) -
MoS2-based ferroelectric field-effect transistor with atomic layer deposited Hf0.5Zr0.5O2 films toward memory applications
by: Ming-Yang Cha, et al.
Published: (2020-06-01) -
Ultrathin WOx interfacial layer improving the ferroelectricity and endurance of Hf0.5Zr0.5O2 thin films on polyimide
by: Chunxu Zhao, et al.
Published: (2025-07-01)