Deep Learning Approach for Multi-Class Segmentation in Industrial CT-Data

In this work, a multiclass segmentation of defects on industrial CT data is performed. The segmentation is implemented by using artificial neural networks (ANNs). Different architectures are evaluated and compared to find the best model architecture for this task. Different metrics for segmentation...

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Bibliographic Details
Main Authors: Tim Schanz, Robin Tenscher-Philipp, Fabian Marschall, Martin Simon
Format: Article
Language:deu
Published: NDT.net 2023-08-01
Series:Research and Review Journal of Nondestructive Testing
Online Access:https://www.ndt.net/search/docs.php3?id=28077