Localization Phenomena in Disordered Tantalum Films

Localization Phenomena in Disordered Tantalum Films

Using dc transport and wide-band spectroscopic ellipsometry techniques we study localization phenomena in highly disordered metallic β -Ta films grown by rf sputtering deposition. The dc transport study implies non-metallic behavior (d ρ /dT < 0), with negative temperature coefficien...

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Bibliographic Details
Main Authors:	Natalia Kovaleva, Dagmar Chvostova, Alexandr Dejneka
Format:	Article
Language:	English
Published:	MDPI AG 2017-07-01
Series:	Metals
Subjects:	disordered metals weak and Anderson localization dc transport spectroscopic ellipsometry
Online Access:	https://www.mdpi.com/2075-4701/7/7/257

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