The methodology for active testing of electronic devices under the radiations
The methodology, developed for active testing of electronic devices under the radiations, is presented. The test set-up includes a gamma-ray facility, the hardware board/fixtures and the software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verif...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
VINCA Institute of Nuclear Sciences
2018-01-01
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| Series: | Nuclear Technology and Radiation Protection |
| Subjects: | |
| Online Access: | http://www.doiserbia.nb.rs/img/doi/1451-3994/2018/1451-39941801053P.pdf |
| _version_ | 1818837072182509568 |
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| author | Parlato Aldo Tomarchio Elio A. Calligaro Cristiano Pace Calogero |
| author_facet | Parlato Aldo Tomarchio Elio A. Calligaro Cristiano Pace Calogero |
| author_sort | Parlato Aldo |
| collection | DOAJ |
| description | The methodology, developed for active testing of electronic devices under the
radiations, is presented. The test set-up includes a gamma-ray facility, the
hardware board/fixtures and the software tools purposely designed and
realized. The methodology is so wide-ranging to allow us the verification of
different classes of electronic devices, even if only application examples
for static random access memory modules are reported. |
| first_indexed | 2024-12-19T03:16:41Z |
| format | Article |
| id | doaj.art-582110f7a2534c60873efe84007b58b4 |
| institution | Directory Open Access Journal |
| issn | 1451-3994 1452-8185 |
| language | English |
| last_indexed | 2024-12-19T03:16:41Z |
| publishDate | 2018-01-01 |
| publisher | VINCA Institute of Nuclear Sciences |
| record_format | Article |
| series | Nuclear Technology and Radiation Protection |
| spelling | doaj.art-582110f7a2534c60873efe84007b58b42022-12-21T20:37:52ZengVINCA Institute of Nuclear SciencesNuclear Technology and Radiation Protection1451-39941452-81852018-01-01331536010.2298/NTRP1801053P1451-39941801053PThe methodology for active testing of electronic devices under the radiationsParlato Aldo0Tomarchio Elio A.1Calligaro Cristiano2Pace Calogero3University of Palermo, Department of Energy, Information Engineering and Mathematical Models, Palermo, Italy + BlueCat Energy, Palermo, Italy + Scientific Research Centre for the Economic Development and Industrial Innovation, Palermo, ItalyUniversity of Palermo, Department of Energy, Information Engineering and Mathematical Models, Palermo, ItalyBlueCat Energy, Palermo, Italy + RedCat Devices, Milano, ItalyUniversity of Calabria, Department of Information Engineering, Rende, ItalyThe methodology, developed for active testing of electronic devices under the radiations, is presented. The test set-up includes a gamma-ray facility, the hardware board/fixtures and the software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for static random access memory modules are reported.http://www.doiserbia.nb.rs/img/doi/1451-3994/2018/1451-39941801053P.pdftesting methodologyelectronic devicetotal ionizing dosesingle event effectgamma ray |
| spellingShingle | Parlato Aldo Tomarchio Elio A. Calligaro Cristiano Pace Calogero The methodology for active testing of electronic devices under the radiations Nuclear Technology and Radiation Protection testing methodology electronic device total ionizing dose single event effect gamma ray |
| title | The methodology for active testing of electronic devices under the radiations |
| title_full | The methodology for active testing of electronic devices under the radiations |
| title_fullStr | The methodology for active testing of electronic devices under the radiations |
| title_full_unstemmed | The methodology for active testing of electronic devices under the radiations |
| title_short | The methodology for active testing of electronic devices under the radiations |
| title_sort | methodology for active testing of electronic devices under the radiations |
| topic | testing methodology electronic device total ionizing dose single event effect gamma ray |
| url | http://www.doiserbia.nb.rs/img/doi/1451-3994/2018/1451-39941801053P.pdf |
| work_keys_str_mv | AT parlatoaldo themethodologyforactivetestingofelectronicdevicesundertheradiations AT tomarchioelioa themethodologyforactivetestingofelectronicdevicesundertheradiations AT calligarocristiano themethodologyforactivetestingofelectronicdevicesundertheradiations AT pacecalogero themethodologyforactivetestingofelectronicdevicesundertheradiations AT parlatoaldo methodologyforactivetestingofelectronicdevicesundertheradiations AT tomarchioelioa methodologyforactivetestingofelectronicdevicesundertheradiations AT calligarocristiano methodologyforactivetestingofelectronicdevicesundertheradiations AT pacecalogero methodologyforactivetestingofelectronicdevicesundertheradiations |