A 6.3-ppm/°C, 100-nA Current Reference With Active Trimming in 28-nm Bulk CMOS Technology
This paper introduces a current reference based on <inline-formula> <tex-math notation="LaTeX">$\Delta V_{GS}$ </tex-math></inline-formula> generation principle and adopts integrated poly-p+ resistors and a nW-power OTA to reduce the line sensitivity. Imp...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
IEEE
2022-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9916267/ |
Summary: | This paper introduces a current reference based on <inline-formula> <tex-math notation="LaTeX">$\Delta V_{GS}$ </tex-math></inline-formula> generation principle and adopts integrated poly-p+ resistors and a nW-power OTA to reduce the line sensitivity. Implemented in a 28-nm standard CMOS technology, the circuit provides a nominal current equal to 100nA and operates down to 0.6V with a line sensitivity equal to 1.2%/V in the range [0.8-1.8]V and a temperature coefficient equal to 6.3ppm/°C in the range [10-90]°C. Comparison with the state-of-the-art confirms the validity of the proposed solution and its suitability to be exploited in ultra-low-power and area-constrained applications. |
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ISSN: | 2169-3536 |