Effect of barrier thickness on photoelectric properties of InGaN/GaN asymmetric multiple-quantum-well structure light-emitting diode

GaN/GaInN asymmetric multiple quantum well light-emitting diodes with varying potential barrier thicknesses (5 and 15 nm) are grown by using metal organic chemical vapor deposition. The narrow barrier structure improves the performance of the device, including the super-linear increase of electrolum...

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Bibliographic Details
Main Authors: Li-E. Cai, Bao-Ping Zhang, Hao-Xiang Lin, Zai-Jun Cheng, Peng-Peng Ren, Zhi-Chao Chen, Jin-Man Huang, Lin-Lin Cai
Format: Article
Language:English
Published: AIP Publishing LLC 2022-06-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0087666
Description
Summary:GaN/GaInN asymmetric multiple quantum well light-emitting diodes with varying potential barrier thicknesses (5 and 15 nm) are grown by using metal organic chemical vapor deposition. The narrow barrier structure improves the performance of the device, including the super-linear increase of electroluminescence integral intensity, the mitigation of efficiency droop at high current density, the reduction of wavelength drift, the reduction of forward voltage, and the improvement of wall-plug efficiency. This is due to the narrowing of the thickness of the quantum barrier, which results in the smaller electric field among the quantum well, the weakening of the quantum confinement Stark effect, the more uniform distribution of carriers across the active region of the device, and the suppression of electron leakage.
ISSN:2158-3226