Effective Evaluation Strategy Toward Low Temperature Solution-Processed Oxide Dielectrics for TFT Device
Solution-processed oxide dielectrics are widely studied as alternatives to SiO<sub>2</sub>, SiN<sub>x</sub> in thin film transistors for high capacitance and low energy consuming. However, it's still a challenge to achieve high quality of solution-processed oxide dielect...
| Main Authors: | , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8890618/ |