X-ray magnetic spectroscopy of MBE-grown Mn-doped Bi2Se3 thin films
We report the growth of Mn-doped Bi2Se3 thin films by molecular beam epitaxy (MBE), investigated by x-ray diffraction (XRD), atomic force microscopy (AFM), SQUID magnetometry and x-ray magnetic circular dichroism (XMCD). Epitaxial films were deposited on c-plane sapphire substrates by co-evaporation...
| Main Authors: | , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2014-12-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4904900 |
| _version_ | 1828395474753683456 |
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| author | L. J. Collins-McIntyre M. D. Watson A. A. Baker S. L. Zhang A. I. Coldea S. E. Harrison A. Pushp A. J. Kellock S. S. P. Parkin G. van der Laan T. Hesjedal |
| author_facet | L. J. Collins-McIntyre M. D. Watson A. A. Baker S. L. Zhang A. I. Coldea S. E. Harrison A. Pushp A. J. Kellock S. S. P. Parkin G. van der Laan T. Hesjedal |
| author_sort | L. J. Collins-McIntyre |
| collection | DOAJ |
| description | We report the growth of Mn-doped Bi2Se3 thin films by molecular beam epitaxy (MBE), investigated by x-ray diffraction (XRD), atomic force microscopy (AFM), SQUID magnetometry and x-ray magnetic circular dichroism (XMCD). Epitaxial films were deposited on c-plane sapphire substrates by co-evaporation. The films exhibit a spiral growth mechanism typical of this material class, as revealed by AFM. The XRD measurements demonstrate a good crystalline structure which is retained upon doping up to ∼7.5 atomic-% Mn, determined by Rutherford backscattering spectrometry (RBS), and show no evidence of the formation of parasitic phases. However an increasing interstitial incorporation of Mn is observed with increasing doping concentration. A magnetic moment of 5.1 μB/Mn is obtained from bulk-sensitive SQUID measurements, and a much lower moment of 1.6 μB/Mn from surface-sensitive XMCD. At ∼2.5 K, XMCD at the Mn L2,3 edge, reveals short-range magnetic order in the films and indicates ferromagnetic order below 1.5 K. |
| first_indexed | 2024-12-10T08:13:22Z |
| format | Article |
| id | doaj.art-596a1f2296a44a33ad44618433b23d88 |
| institution | Directory Open Access Journal |
| issn | 2158-3226 |
| language | English |
| last_indexed | 2024-12-10T08:13:22Z |
| publishDate | 2014-12-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | AIP Advances |
| spelling | doaj.art-596a1f2296a44a33ad44618433b23d882022-12-22T01:56:31ZengAIP Publishing LLCAIP Advances2158-32262014-12-01412127136127136-1110.1063/1.4904900036412ADVX-ray magnetic spectroscopy of MBE-grown Mn-doped Bi2Se3 thin filmsL. J. Collins-McIntyre0M. D. Watson1A. A. Baker2S. L. Zhang3A. I. Coldea4S. E. Harrison5A. Pushp6A. J. Kellock7S. S. P. Parkin8G. van der Laan9T. Hesjedal10Department of Physics, Clarendon Laboratory, University of Oxford, Oxford, OX1 3PU, United KingdomDepartment of Physics, Clarendon Laboratory, University of Oxford, Oxford, OX1 3PU, United KingdomDepartment of Physics, Clarendon Laboratory, University of Oxford, Oxford, OX1 3PU, United KingdomDepartment of Physics, Clarendon Laboratory, University of Oxford, Oxford, OX1 3PU, United KingdomDepartment of Physics, Clarendon Laboratory, University of Oxford, Oxford, OX1 3PU, United KingdomDepartment of Electrical Engineering, Stanford University, Stanford, California 94305, USAIBM Almaden Research Center, 650 Harry Road, San Jose, California 95120, USAIBM Almaden Research Center, 650 Harry Road, San Jose, California 95120, USAIBM Almaden Research Center, 650 Harry Road, San Jose, California 95120, USAMagnetic Spectroscopy Group, Diamond Light Source, Didcot, OX11 0DE, United KingdomDepartment of Physics, Clarendon Laboratory, University of Oxford, Oxford, OX1 3PU, United KingdomWe report the growth of Mn-doped Bi2Se3 thin films by molecular beam epitaxy (MBE), investigated by x-ray diffraction (XRD), atomic force microscopy (AFM), SQUID magnetometry and x-ray magnetic circular dichroism (XMCD). Epitaxial films were deposited on c-plane sapphire substrates by co-evaporation. The films exhibit a spiral growth mechanism typical of this material class, as revealed by AFM. The XRD measurements demonstrate a good crystalline structure which is retained upon doping up to ∼7.5 atomic-% Mn, determined by Rutherford backscattering spectrometry (RBS), and show no evidence of the formation of parasitic phases. However an increasing interstitial incorporation of Mn is observed with increasing doping concentration. A magnetic moment of 5.1 μB/Mn is obtained from bulk-sensitive SQUID measurements, and a much lower moment of 1.6 μB/Mn from surface-sensitive XMCD. At ∼2.5 K, XMCD at the Mn L2,3 edge, reveals short-range magnetic order in the films and indicates ferromagnetic order below 1.5 K.http://dx.doi.org/10.1063/1.4904900 |
| spellingShingle | L. J. Collins-McIntyre M. D. Watson A. A. Baker S. L. Zhang A. I. Coldea S. E. Harrison A. Pushp A. J. Kellock S. S. P. Parkin G. van der Laan T. Hesjedal X-ray magnetic spectroscopy of MBE-grown Mn-doped Bi2Se3 thin films AIP Advances |
| title | X-ray magnetic spectroscopy of MBE-grown Mn-doped Bi2Se3 thin films |
| title_full | X-ray magnetic spectroscopy of MBE-grown Mn-doped Bi2Se3 thin films |
| title_fullStr | X-ray magnetic spectroscopy of MBE-grown Mn-doped Bi2Se3 thin films |
| title_full_unstemmed | X-ray magnetic spectroscopy of MBE-grown Mn-doped Bi2Se3 thin films |
| title_short | X-ray magnetic spectroscopy of MBE-grown Mn-doped Bi2Se3 thin films |
| title_sort | x ray magnetic spectroscopy of mbe grown mn doped bi2se3 thin films |
| url | http://dx.doi.org/10.1063/1.4904900 |
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