Features of manufacturing Cd1–xZnxTe ionizing radiation detector

Features of manufacturing Cd1–xZnxTe ionizing radiation detector

The article describes a newly-developed method of manufacturing of an operating element of the Cd1–xZnxTe-detector of ionizing radiation with high sensitivity to low-energy gamma radiation of the americium 241Am radioactive isotope. The proposed two-step method of chemical surface treatment with the...

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Bibliographic Details
Main Authors: Tomashik Z. F., Stratiichuk I. B., Tomashik V. N., Budzulyak S. I., Gnativ I. I., Komar V. K., Dubina N. G., Lots’ko A. P., Korbutyak D. V., Demchina L. A., Vakhnyak N. D.
Format: Article
Language:English
Published: Politehperiodika 2013-02-01
Series:Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
Subjects:
radiation detectors
semiconductor
chemical etching
chemical-dynamic polishing
chemical-mechanical polishing
Online Access:http://www.tkea.com.ua/tkea/2013/1_2013/pdf/07.zip
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Summary:The article describes a newly-developed method of manufacturing of an operating element of the Cd1–xZnxTe-detector of ionizing radiation with high sensitivity to low-energy gamma radiation of the americium 241Am radioactive isotope. The proposed two-step method of chemical surface treatment with the use of new bromine releasing polishing etchants significantly improves the quality of the detector material and increases its specific sensitivity to ionizing radiation. This allows to use smaller Cd1–xZnxTe plates, which results in lowering of the cost of detectors.
ISSN:2225-5818

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