Trends and Volatilities in Heterogeneous Patent Quality in Taiwan

This study analyzes patent trends and volatilities for three heterogeneous quality patents in the Taiwan patent system from January 1973 to June 2006. The estimated models are symmetric GARCH and asymmetric EGARCH, providing full sample, rolling sample, and out-of-sample evidence. Three different pa...

Full description

Bibliographic Details
Main Authors: Wen-Cheng Lu, Jong-Rong Chen, I-Hsuan Tung
Format: Article
Language:English
Published: Universidad Alberto Hurtado 2009-07-01
Series:Journal of Technology Management & Innovation
Subjects:
Online Access:https://www.jotmi.org/index.php/GT/article/view/478
Description
Summary:This study analyzes patent trends and volatilities for three heterogeneous quality patents in the Taiwan patent system from January 1973 to June 2006. The estimated models are symmetric GARCH and asymmetric EGARCH, providing full sample, rolling sample, and out-of-sample evidence. Three different patent types exhibit increasing trends, using monthly time series data from our samples. ”New design” patents also show time-varying volatility but other types of patents fail to reject the ARCH LM test. Findings show the asymmetric EGARCH model suitable for “new design” patent type through out of sample forecasts.
ISSN:0718-2724