An Image Processing Method for Extraction of the Stress Wave Reflection Period
The stress wave reflection method is widely used in the detection of structure size and integrity due to its advantages of low environmental impact and convenience. The detection accuracy depends on the accurate extraction of the stress wave reflection period. The traditional peak–peak method (PPM)...
Main Authors: | Panpan Gong, Mingzhang Luo, Luoyu Zhou, Liming Jiang, Xuemin Chen |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2020-05-01
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Series: | Applied Sciences |
Subjects: | |
Online Access: | https://www.mdpi.com/2076-3417/10/10/3486 |
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