The atomic force microscope as a mechano–electrochemical pen
We demonstrate a method that allows the controlled writing of metallic patterns on the nanometer scale using the tip of an atomic force microscope (AFM) as a “mechano–electrochemical pen”. In contrast to previous experiments, no voltage is applied between the AFM tip and the sample surface. Instead,...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Beilstein-Institut
2011-10-01
|
| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.2.70 |
| _version_ | 1818162286768947200 |
|---|---|
| author | Christian Obermair Andreas Wagner Thomas Schimmel |
| author_facet | Christian Obermair Andreas Wagner Thomas Schimmel |
| author_sort | Christian Obermair |
| collection | DOAJ |
| description | We demonstrate a method that allows the controlled writing of metallic patterns on the nanometer scale using the tip of an atomic force microscope (AFM) as a “mechano–electrochemical pen”. In contrast to previous experiments, no voltage is applied between the AFM tip and the sample surface. Instead, a passivated sample surface is activated locally due to lateral forces between the AFM tip and the sample surface. In this way, the area of tip–sample interaction is narrowly limited by the mechanical contact between tip and sample, and well-defined metallic patterns can be written reproducibly. Nanoscale structures and lines of copper were deposited, and the line widths ranged between 5 nm and 80 nm, depending on the deposition parameters. A procedure for the sequential writing of metallic nanostructures is introduced, based on the understanding of the passivation process. The mechanism of this mechano–electrochemical writing technique is investigated, and the processes of site-selective surface depassivation, deposition, dissolution and repassivation of electrochemically deposited nanoscale metallic islands are studied in detail. |
| first_indexed | 2024-12-11T16:31:15Z |
| format | Article |
| id | doaj.art-5a6179f00b754407beb04e346ba281fc |
| institution | Directory Open Access Journal |
| issn | 2190-4286 |
| language | English |
| last_indexed | 2024-12-11T16:31:15Z |
| publishDate | 2011-10-01 |
| publisher | Beilstein-Institut |
| record_format | Article |
| series | Beilstein Journal of Nanotechnology |
| spelling | doaj.art-5a6179f00b754407beb04e346ba281fc2022-12-22T00:58:35ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862011-10-012165966410.3762/bjnano.2.702190-4286-2-70The atomic force microscope as a mechano–electrochemical penChristian Obermair0Andreas Wagner1Thomas Schimmel2Institute of Applied Physics and Center for Functional Nanostructures (CFN), South Campus, Karlsruhe Institute of Technology (KIT), 76128 Karlsruhe, GermanyInstitute of Applied Physics and Center for Functional Nanostructures (CFN), South Campus, Karlsruhe Institute of Technology (KIT), 76128 Karlsruhe, GermanyInstitute of Applied Physics and Center for Functional Nanostructures (CFN), South Campus, Karlsruhe Institute of Technology (KIT), 76128 Karlsruhe, GermanyWe demonstrate a method that allows the controlled writing of metallic patterns on the nanometer scale using the tip of an atomic force microscope (AFM) as a “mechano–electrochemical pen”. In contrast to previous experiments, no voltage is applied between the AFM tip and the sample surface. Instead, a passivated sample surface is activated locally due to lateral forces between the AFM tip and the sample surface. In this way, the area of tip–sample interaction is narrowly limited by the mechanical contact between tip and sample, and well-defined metallic patterns can be written reproducibly. Nanoscale structures and lines of copper were deposited, and the line widths ranged between 5 nm and 80 nm, depending on the deposition parameters. A procedure for the sequential writing of metallic nanostructures is introduced, based on the understanding of the passivation process. The mechanism of this mechano–electrochemical writing technique is investigated, and the processes of site-selective surface depassivation, deposition, dissolution and repassivation of electrochemically deposited nanoscale metallic islands are studied in detail.https://doi.org/10.3762/bjnano.2.70atomic force microscopydepositionelectrochemistrynanoelectronicsnanofabricationnanolithographynanotechnologyNEMS and MEMSscanning probe lithography |
| spellingShingle | Christian Obermair Andreas Wagner Thomas Schimmel The atomic force microscope as a mechano–electrochemical pen Beilstein Journal of Nanotechnology atomic force microscopy deposition electrochemistry nanoelectronics nanofabrication nanolithography nanotechnology NEMS and MEMS scanning probe lithography |
| title | The atomic force microscope as a mechano–electrochemical pen |
| title_full | The atomic force microscope as a mechano–electrochemical pen |
| title_fullStr | The atomic force microscope as a mechano–electrochemical pen |
| title_full_unstemmed | The atomic force microscope as a mechano–electrochemical pen |
| title_short | The atomic force microscope as a mechano–electrochemical pen |
| title_sort | atomic force microscope as a mechano electrochemical pen |
| topic | atomic force microscopy deposition electrochemistry nanoelectronics nanofabrication nanolithography nanotechnology NEMS and MEMS scanning probe lithography |
| url | https://doi.org/10.3762/bjnano.2.70 |
| work_keys_str_mv | AT christianobermair theatomicforcemicroscopeasamechanoelectrochemicalpen AT andreaswagner theatomicforcemicroscopeasamechanoelectrochemicalpen AT thomasschimmel theatomicforcemicroscopeasamechanoelectrochemicalpen AT christianobermair atomicforcemicroscopeasamechanoelectrochemicalpen AT andreaswagner atomicforcemicroscopeasamechanoelectrochemicalpen AT thomasschimmel atomicforcemicroscopeasamechanoelectrochemicalpen |