Adaptive Correction Method of Uneven Intensity in Fourier Ptychographic Microscopy
Fourier ptychographic microscopy (FPM) is a computational imaging technique that combines a large field of view and high-resolution. It stitches low-resolution images captured under varying illumination corresponding to different angles in the frequency domain to realize quantitative phase imaging w...
| Main Authors: | , , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2022-01-01
|
| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9964032/ |
| _version_ | 1828091714576842752 |
|---|---|
| author | Luo Jiaxiong Wu Ruofei Luo Zicong Tan Haishu Zhen Junrui Zhu Sicong Chen Hanbao Li Jiancong Wu Yanxiong |
| author_facet | Luo Jiaxiong Wu Ruofei Luo Zicong Tan Haishu Zhen Junrui Zhu Sicong Chen Hanbao Li Jiancong Wu Yanxiong |
| author_sort | Luo Jiaxiong |
| collection | DOAJ |
| description | Fourier ptychographic microscopy (FPM) is a computational imaging technique that combines a large field of view and high-resolution. It stitches low-resolution images captured under varying illumination corresponding to different angles in the frequency domain to realize quantitative phase imaging with high spatial bandwidth product. Our previous algorithm (AA algorithm) effectively solves the problem of noise interference and the algorithm is difficult to converge. In FPM experiments, the fluctuation of LED intensity is inevitable, which significantly affects the quality of reconstructed images. The usual solution is to perform intensity correction in the reconstruction algorithm. However, in this study, it is found that the AA algorithm is incompatible with the intensity correction method, which will decrease the convergence performance. To solve this problem, we develop a more general reconstruction algorithm based on the AA algorithm in this study. The simulation and experimental results show that the improved algorithm framework is compatible with the intensity correction method, resulting in an increase in intensity correction reliability and effectiveness. Compared with the GS and AS methods with intensity correction, the error in reconstruction results can be reduced by 52.03% and 29.35%, respectively, without increasing the amount of calculation. |
| first_indexed | 2024-04-11T06:18:26Z |
| format | Article |
| id | doaj.art-5a7d2537846a493e9666139d74664210 |
| institution | Directory Open Access Journal |
| issn | 1943-0655 |
| language | English |
| last_indexed | 2024-04-11T06:18:26Z |
| publishDate | 2022-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Photonics Journal |
| spelling | doaj.art-5a7d2537846a493e9666139d746642102022-12-22T04:40:59ZengIEEEIEEE Photonics Journal1943-06552022-01-011461610.1109/JPHOT.2022.32248469964032Adaptive Correction Method of Uneven Intensity in Fourier Ptychographic MicroscopyLuo Jiaxiong0https://orcid.org/0000-0001-7253-0607Wu Ruofei1Luo Zicong2Tan Haishu3Zhen Junrui4Zhu Sicong5Chen Hanbao6Li Jiancong7Wu Yanxiong8https://orcid.org/0000-0003-3592-7175School of Physics and Optoelectronic Engineering, Foshan Uniiversity, Foshan, ChinaSchool of Physics and Optoelectronic Engineering, Foshan Uniiversity, Foshan, ChinaSchool of Physics and Optoelectronic Engineering, Foshan Uniiversity, Foshan, ChinaSchool of Physics and Optoelectronic Engineering, Foshan Uniiversity, Foshan, ChinaSchool of Physics and Optoelectronic Engineering, Foshan Uniiversity, Foshan, ChinaSchool of Physics and Optoelectronic Engineering, Foshan Uniiversity, Foshan, ChinaSchool of Physics and Optoelectronic Engineering, Foshan Uniiversity, Foshan, ChinaSchool of Physics and Optoelectronic Engineering, Foshan Uniiversity, Foshan, ChinaSchool of Physics and Optoelectronic Engineering, Foshan Uniiversity, Foshan, ChinaFourier ptychographic microscopy (FPM) is a computational imaging technique that combines a large field of view and high-resolution. It stitches low-resolution images captured under varying illumination corresponding to different angles in the frequency domain to realize quantitative phase imaging with high spatial bandwidth product. Our previous algorithm (AA algorithm) effectively solves the problem of noise interference and the algorithm is difficult to converge. In FPM experiments, the fluctuation of LED intensity is inevitable, which significantly affects the quality of reconstructed images. The usual solution is to perform intensity correction in the reconstruction algorithm. However, in this study, it is found that the AA algorithm is incompatible with the intensity correction method, which will decrease the convergence performance. To solve this problem, we develop a more general reconstruction algorithm based on the AA algorithm in this study. The simulation and experimental results show that the improved algorithm framework is compatible with the intensity correction method, resulting in an increase in intensity correction reliability and effectiveness. Compared with the GS and AS methods with intensity correction, the error in reconstruction results can be reduced by 52.03% and 29.35%, respectively, without increasing the amount of calculation.https://ieeexplore.ieee.org/document/9964032/Fourier ptychographic microscopyintensity fluctuationphase retrievalintensity correctionimage quality |
| spellingShingle | Luo Jiaxiong Wu Ruofei Luo Zicong Tan Haishu Zhen Junrui Zhu Sicong Chen Hanbao Li Jiancong Wu Yanxiong Adaptive Correction Method of Uneven Intensity in Fourier Ptychographic Microscopy IEEE Photonics Journal Fourier ptychographic microscopy intensity fluctuation phase retrieval intensity correction image quality |
| title | Adaptive Correction Method of Uneven Intensity in Fourier Ptychographic Microscopy |
| title_full | Adaptive Correction Method of Uneven Intensity in Fourier Ptychographic Microscopy |
| title_fullStr | Adaptive Correction Method of Uneven Intensity in Fourier Ptychographic Microscopy |
| title_full_unstemmed | Adaptive Correction Method of Uneven Intensity in Fourier Ptychographic Microscopy |
| title_short | Adaptive Correction Method of Uneven Intensity in Fourier Ptychographic Microscopy |
| title_sort | adaptive correction method of uneven intensity in fourier ptychographic microscopy |
| topic | Fourier ptychographic microscopy intensity fluctuation phase retrieval intensity correction image quality |
| url | https://ieeexplore.ieee.org/document/9964032/ |
| work_keys_str_mv | AT luojiaxiong adaptivecorrectionmethodofunevenintensityinfourierptychographicmicroscopy AT wuruofei adaptivecorrectionmethodofunevenintensityinfourierptychographicmicroscopy AT luozicong adaptivecorrectionmethodofunevenintensityinfourierptychographicmicroscopy AT tanhaishu adaptivecorrectionmethodofunevenintensityinfourierptychographicmicroscopy AT zhenjunrui adaptivecorrectionmethodofunevenintensityinfourierptychographicmicroscopy AT zhusicong adaptivecorrectionmethodofunevenintensityinfourierptychographicmicroscopy AT chenhanbao adaptivecorrectionmethodofunevenintensityinfourierptychographicmicroscopy AT lijiancong adaptivecorrectionmethodofunevenintensityinfourierptychographicmicroscopy AT wuyanxiong adaptivecorrectionmethodofunevenintensityinfourierptychographicmicroscopy |