New Figure-of-Merit Combining Semiconductor and Multi-Level Converter Properties
Figures-of-Merit (FOMs) are widely-used to compare power semiconductor materials and devices and to motivate research and development of new technology nodes. These material- and device-specific FOMs, however, fail to directly translate into quantifiable performance in a specific power electronics a...
| Main Authors: | , , , |
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| 格式: | 文件 |
| 语言: | English |
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IEEE
2020-01-01
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| 丛编: | IEEE Open Journal of Power Electronics |
| 主题: | |
| 在线阅读: | https://ieeexplore.ieee.org/document/9172101/ |