Simplified Determination of RHEED Patterns and Its Explanation Shown with the Use of 3D Computer Graphics
The process of preparation of nanostructured thin films in high vacuum can be monitored with the help of reflection high energy diffraction (RHEED). However, RHEED patterns, both observed or recorded, need to be interpreted. The simplest approaches are based on carrying out the Ewald construction fo...
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-06-01
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| Series: | Materials |
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| Online Access: | https://www.mdpi.com/1996-1944/14/11/3056 |
| _version_ | 1797531443373539328 |
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| author | Łukasz Kokosza Jakub Pawlak Zbigniew Mitura Marek Przybylski |
| author_facet | Łukasz Kokosza Jakub Pawlak Zbigniew Mitura Marek Przybylski |
| author_sort | Łukasz Kokosza |
| collection | DOAJ |
| description | The process of preparation of nanostructured thin films in high vacuum can be monitored with the help of reflection high energy diffraction (RHEED). However, RHEED patterns, both observed or recorded, need to be interpreted. The simplest approaches are based on carrying out the Ewald construction for a set of rods perpendicular to the crystal surface. This article describes how the utilization of computer graphics may be useful for realistic reproduction of experimental conditions, and then for carrying out the Ewald construction in a reciprocal 3D space. The computer software was prepared in the Java programing language. The software can be used to interpret real diffractions patterns for relatively flat surfaces, and thus it may be helpful in broad research practice. |
| first_indexed | 2024-03-10T10:43:53Z |
| format | Article |
| id | doaj.art-5b87baaed1e84d32b3ec8645cdae1b25 |
| institution | Directory Open Access Journal |
| issn | 1996-1944 |
| language | English |
| last_indexed | 2024-03-10T10:43:53Z |
| publishDate | 2021-06-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Materials |
| spelling | doaj.art-5b87baaed1e84d32b3ec8645cdae1b252023-11-21T22:43:13ZengMDPI AGMaterials1996-19442021-06-011411305610.3390/ma14113056Simplified Determination of RHEED Patterns and Its Explanation Shown with the Use of 3D Computer GraphicsŁukasz Kokosza0Jakub Pawlak1Zbigniew Mitura2Marek Przybylski3Faculty of Metals Engineering and Industrial Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, PolandFaculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, PolandFaculty of Metals Engineering and Industrial Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, PolandFaculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, PolandThe process of preparation of nanostructured thin films in high vacuum can be monitored with the help of reflection high energy diffraction (RHEED). However, RHEED patterns, both observed or recorded, need to be interpreted. The simplest approaches are based on carrying out the Ewald construction for a set of rods perpendicular to the crystal surface. This article describes how the utilization of computer graphics may be useful for realistic reproduction of experimental conditions, and then for carrying out the Ewald construction in a reciprocal 3D space. The computer software was prepared in the Java programing language. The software can be used to interpret real diffractions patterns for relatively flat surfaces, and thus it may be helpful in broad research practice.https://www.mdpi.com/1996-1944/14/11/3056nanostructured materialskinematical diffraction theoryEwald constructioncomputer visualization |
| spellingShingle | Łukasz Kokosza Jakub Pawlak Zbigniew Mitura Marek Przybylski Simplified Determination of RHEED Patterns and Its Explanation Shown with the Use of 3D Computer Graphics Materials nanostructured materials kinematical diffraction theory Ewald construction computer visualization |
| title | Simplified Determination of RHEED Patterns and Its Explanation Shown with the Use of 3D Computer Graphics |
| title_full | Simplified Determination of RHEED Patterns and Its Explanation Shown with the Use of 3D Computer Graphics |
| title_fullStr | Simplified Determination of RHEED Patterns and Its Explanation Shown with the Use of 3D Computer Graphics |
| title_full_unstemmed | Simplified Determination of RHEED Patterns and Its Explanation Shown with the Use of 3D Computer Graphics |
| title_short | Simplified Determination of RHEED Patterns and Its Explanation Shown with the Use of 3D Computer Graphics |
| title_sort | simplified determination of rheed patterns and its explanation shown with the use of 3d computer graphics |
| topic | nanostructured materials kinematical diffraction theory Ewald construction computer visualization |
| url | https://www.mdpi.com/1996-1944/14/11/3056 |
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