Simplified Determination of RHEED Patterns and Its Explanation Shown with the Use of 3D Computer Graphics
The process of preparation of nanostructured thin films in high vacuum can be monitored with the help of reflection high energy diffraction (RHEED). However, RHEED patterns, both observed or recorded, need to be interpreted. The simplest approaches are based on carrying out the Ewald construction fo...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-06-01
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| Series: | Materials |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1996-1944/14/11/3056 |