A Non-Arrhenius Model for Mechanism Consistency Checking in Accelerated Degradation Tests
Degradation models are central to the lifetime prediction of electromagnetic relays. Coefficients of degradation models under accelerated degradation test (ADTs) can be obtained experimentally, and it is customary to map these coefficients back to those describing the actual degradation by the so-ca...
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MDPI AG
2023-08-01
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Online Access: | https://www.mdpi.com/2076-0825/12/8/319 |
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author | Jiaxin You Rao Fu Huimin Liang Yigang Lin |
author_facet | Jiaxin You Rao Fu Huimin Liang Yigang Lin |
author_sort | Jiaxin You |
collection | DOAJ |
description | Degradation models are central to the lifetime prediction of electromagnetic relays. Coefficients of degradation models under accelerated degradation test (ADTs) can be obtained experimentally, and it is customary to map these coefficients back to those describing the actual degradation by the so-called Arrhenius model. However, for some components, such as springs in electromagnetic relays, the Arrhenius model is only appropriate over a certain ADT temperature range, which implies inaccurate mapping outside that range. On this point, an error function model (EFM) is proposed to overcome the shortcomings of the Arrhenius model. EFM is derived from the average vibration energy of the crystal, which is further related to temperature alongside some constants. The empirical part of the paper compares the proposed EFM to the Arrhenius model for the ADT of 28-V–2-A electromagnetic relays. The results show that EFM is superior in describing the temperature characteristics of coefficients in the degradation model. Through mechanism consistency checking, EFM is also shown to be a better option than the Arrhenius model. Moving beyond the case of electromagnetic relays, EFM is thought to have better applicability in the degradation models of capacitors and rubbers. |
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issn | 2076-0825 |
language | English |
last_indexed | 2024-03-11T00:13:25Z |
publishDate | 2023-08-01 |
publisher | MDPI AG |
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spelling | doaj.art-5bee77743af9443398ee349e14fcb1712023-11-18T23:48:55ZengMDPI AGActuators2076-08252023-08-0112831910.3390/act12080319A Non-Arrhenius Model for Mechanism Consistency Checking in Accelerated Degradation TestsJiaxin You0Rao Fu1Huimin Liang2Yigang Lin3School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin 150001, ChinaSchool of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin 150001, ChinaSchool of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin 150001, ChinaCollege of Electrical and Electronic Engineering, Wenzhou University, Wenzhou 325035, ChinaDegradation models are central to the lifetime prediction of electromagnetic relays. Coefficients of degradation models under accelerated degradation test (ADTs) can be obtained experimentally, and it is customary to map these coefficients back to those describing the actual degradation by the so-called Arrhenius model. However, for some components, such as springs in electromagnetic relays, the Arrhenius model is only appropriate over a certain ADT temperature range, which implies inaccurate mapping outside that range. On this point, an error function model (EFM) is proposed to overcome the shortcomings of the Arrhenius model. EFM is derived from the average vibration energy of the crystal, which is further related to temperature alongside some constants. The empirical part of the paper compares the proposed EFM to the Arrhenius model for the ADT of 28-V–2-A electromagnetic relays. The results show that EFM is superior in describing the temperature characteristics of coefficients in the degradation model. Through mechanism consistency checking, EFM is also shown to be a better option than the Arrhenius model. Moving beyond the case of electromagnetic relays, EFM is thought to have better applicability in the degradation models of capacitors and rubbers.https://www.mdpi.com/2076-0825/12/8/319accelerated degradation testArrhenius modelerror function modellifetime predictionmechanism consistency checkingvibration energy of crystals |
spellingShingle | Jiaxin You Rao Fu Huimin Liang Yigang Lin A Non-Arrhenius Model for Mechanism Consistency Checking in Accelerated Degradation Tests Actuators accelerated degradation test Arrhenius model error function model lifetime prediction mechanism consistency checking vibration energy of crystals |
title | A Non-Arrhenius Model for Mechanism Consistency Checking in Accelerated Degradation Tests |
title_full | A Non-Arrhenius Model for Mechanism Consistency Checking in Accelerated Degradation Tests |
title_fullStr | A Non-Arrhenius Model for Mechanism Consistency Checking in Accelerated Degradation Tests |
title_full_unstemmed | A Non-Arrhenius Model for Mechanism Consistency Checking in Accelerated Degradation Tests |
title_short | A Non-Arrhenius Model for Mechanism Consistency Checking in Accelerated Degradation Tests |
title_sort | non arrhenius model for mechanism consistency checking in accelerated degradation tests |
topic | accelerated degradation test Arrhenius model error function model lifetime prediction mechanism consistency checking vibration energy of crystals |
url | https://www.mdpi.com/2076-0825/12/8/319 |
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