Thermal Face Verification through Identification

This paper reports on a new approach to face verification in long-wavelength infrared radiation. Two face images were combined into one double image, which was then used as an input for a classification based on neural networks. For testing, we exploited two external and one homemade thermal face da...

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Bibliographic Details
Main Authors: Artur Grudzień, Marcin Kowalski, Norbert Pałka
Format: Article
Language:English
Published: MDPI AG 2021-05-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/21/9/3301
Description
Summary:This paper reports on a new approach to face verification in long-wavelength infrared radiation. Two face images were combined into one double image, which was then used as an input for a classification based on neural networks. For testing, we exploited two external and one homemade thermal face databases acquired in various variants. The method is reported to achieve a true acceptance rate of about 83%. We proved that the proposed method outperforms other studied baseline methods by about 20 percentage points. We also analyzed the issue of extending the performance of algorithms. We believe that the proposed double image method can also be applied to other spectral ranges and modalities different than the face.
ISSN:1424-8220