Unconventional resistivity scaling in topological semimetal CoSi

Abstract Nontrivial band topologies in semimetals lead to robust surface states that can contribute dominantly to the total conduction. This may result in reduced resistivity with decreasing feature size contrary to conventional metals, which may highly impact the semiconductor industry. Here we stu...

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Main Authors: Shang-Wei Lien, Ion Garate, Utkarsh Bajpai, Cheng-Yi Huang, Chuang-Han Hsu, Yi-Hsin Tu, Nicholas A. Lanzillo, Arun Bansil, Tay-Rong Chang, Gengchiau Liang, Hsin Lin, Ching-Tzu Chen
Format: Article
Language:English
Published: Nature Portfolio 2023-01-01
Series:npj Quantum Materials
Online Access:https://doi.org/10.1038/s41535-022-00535-6
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author Shang-Wei Lien
Ion Garate
Utkarsh Bajpai
Cheng-Yi Huang
Chuang-Han Hsu
Yi-Hsin Tu
Nicholas A. Lanzillo
Arun Bansil
Tay-Rong Chang
Gengchiau Liang
Hsin Lin
Ching-Tzu Chen
author_facet Shang-Wei Lien
Ion Garate
Utkarsh Bajpai
Cheng-Yi Huang
Chuang-Han Hsu
Yi-Hsin Tu
Nicholas A. Lanzillo
Arun Bansil
Tay-Rong Chang
Gengchiau Liang
Hsin Lin
Ching-Tzu Chen
author_sort Shang-Wei Lien
collection DOAJ
description Abstract Nontrivial band topologies in semimetals lead to robust surface states that can contribute dominantly to the total conduction. This may result in reduced resistivity with decreasing feature size contrary to conventional metals, which may highly impact the semiconductor industry. Here we study the resistivity scaling of a representative topological semimetal CoSi using realistic band structures and Green’s function methods. We show that there exists a critical thickness d c dividing different scaling trends. Above d c , when the defect density is low such that surface conduction dominates, resistivity reduces with decreasing thickness; when the defect density is high such that bulk conduction dominates, resistivity increases as in conventional metals. Below d c where bulk states are depopulated, the persistent Fermi-arc remnant states give rise to decreasing resistivity down to the ultrathin limit, unlike topological insulators. The observed CoSi scaling can apply to broad classes of topological semimetals, providing guidelines for materials screening in back-end-of-line interconnect applications.
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spelling doaj.art-5c33fe2abff24c238e2a9771dec740fa2023-01-15T12:03:42ZengNature Portfolionpj Quantum Materials2397-46482023-01-01811910.1038/s41535-022-00535-6Unconventional resistivity scaling in topological semimetal CoSiShang-Wei Lien0Ion Garate1Utkarsh Bajpai2Cheng-Yi Huang3Chuang-Han Hsu4Yi-Hsin Tu5Nicholas A. Lanzillo6Arun Bansil7Tay-Rong Chang8Gengchiau Liang9Hsin Lin10Ching-Tzu Chen11Department of Physics, National Cheng Kung UniversityDépartement de Physique, Institut Quantique and Regroupement Québécois sur les Matériaux de Pointe, Université de SherbrookeIBM ResearchDepartment of Physics, Northeastern UniversityInstitute of Physics, Academia SinicaDepartment of Physics, National Cheng Kung UniversityIBM ResearchDepartment of Physics, Northeastern UniversityDepartment of Physics, National Cheng Kung UniversityDepartment of Electrical and Computer Engineering, College of Design and Engineering, National University of SingaporeInstitute of Physics, Academia SinicaIBM T.J. Watson Research CenterAbstract Nontrivial band topologies in semimetals lead to robust surface states that can contribute dominantly to the total conduction. This may result in reduced resistivity with decreasing feature size contrary to conventional metals, which may highly impact the semiconductor industry. Here we study the resistivity scaling of a representative topological semimetal CoSi using realistic band structures and Green’s function methods. We show that there exists a critical thickness d c dividing different scaling trends. Above d c , when the defect density is low such that surface conduction dominates, resistivity reduces with decreasing thickness; when the defect density is high such that bulk conduction dominates, resistivity increases as in conventional metals. Below d c where bulk states are depopulated, the persistent Fermi-arc remnant states give rise to decreasing resistivity down to the ultrathin limit, unlike topological insulators. The observed CoSi scaling can apply to broad classes of topological semimetals, providing guidelines for materials screening in back-end-of-line interconnect applications.https://doi.org/10.1038/s41535-022-00535-6
spellingShingle Shang-Wei Lien
Ion Garate
Utkarsh Bajpai
Cheng-Yi Huang
Chuang-Han Hsu
Yi-Hsin Tu
Nicholas A. Lanzillo
Arun Bansil
Tay-Rong Chang
Gengchiau Liang
Hsin Lin
Ching-Tzu Chen
Unconventional resistivity scaling in topological semimetal CoSi
npj Quantum Materials
title Unconventional resistivity scaling in topological semimetal CoSi
title_full Unconventional resistivity scaling in topological semimetal CoSi
title_fullStr Unconventional resistivity scaling in topological semimetal CoSi
title_full_unstemmed Unconventional resistivity scaling in topological semimetal CoSi
title_short Unconventional resistivity scaling in topological semimetal CoSi
title_sort unconventional resistivity scaling in topological semimetal cosi
url https://doi.org/10.1038/s41535-022-00535-6
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