High-Resolution Crack Localization Approach Based on Diffraction Wave

The delay-and-sum imaging algorithm is a promising crack localization approach for crack detection and monitoring of key structural regions. Most studies successfully offer a hole-like damage position. However, cracks are more common than hole-like damages in a structure. To solve this issue, this p...

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Bibliographic Details
Main Authors: Weilei Mu, Jiangang Sun, Guijie Liu, Shuqing Wang
Format: Article
Language:English
Published: MDPI AG 2019-04-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/19/8/1951
Description
Summary:The delay-and-sum imaging algorithm is a promising crack localization approach for crack detection and monitoring of key structural regions. Most studies successfully offer a hole-like damage position. However, cracks are more common than hole-like damages in a structure. To solve this issue, this paper presents a crack localization approach, based on diffraction wave theory, which is capable of imaging crack endpoints. The guided wave propagated to the crack endpoints and transformed into a diffraction wave. A line sensor array was used to record the diffraction waveform. Then, dispersion compensation was applied to shorten the dispersive wave packets and separate the overlapping wave packets. Subsequently, half-wave compensation was executed to improve the localization accuracy. Finally, the effectiveness of this high-resolution crack localization method was validated by an experimental example.
ISSN:1424-8220