Devices for express diagnostics of power semiconductor devices and semiconductor converters
The increase in the power of power semiconductor converters operated in the railway industry is associated with the use of group connections of power semiconductor devices in them, the variation in the parameters of which, and, therefore, their unequal load, causes a decrease in the reliability o...
| _version_ | 1797794560507641856 |
|---|---|
| author | E. B. Koroleva S. M. Kurmashev K. K. Kim A. A. Tkachuk A. A. Kuznetsov |
| author_facet | E. B. Koroleva S. M. Kurmashev K. K. Kim A. A. Tkachuk A. A. Kuznetsov |
| author_sort | E. B. Koroleva |
| collection | DOAJ |
| description | The increase in the power of power semiconductor converters operated in
the railway industry is associated with the use of group connections of power
semiconductor devices in them, the variation in the parameters of which, and,
therefore, their unequal load, causes a decrease in the reliability of the power
semiconductor converters as a whole. In this regard, it becomes necessary to develop
and implement innovative methods and devices for express diagnostics in order
to identify potentially unreliable semiconductor devices, and the implementation
of technical diagnostics should not be associated with dismantling the electrical
circuits of the converters. The method is proposed for determining potentially
unreliable power semiconductor devices in group connections based on the results
of analyzing the distribution of reverse currents in parallel branches, which made it
possible to create a series of devices for diagnosing power semiconductor devices
in converters, both with and without communication resistors. The methodological
error of measurements made using the developed express diagnostics devices of
the transducers do not exceed the standard value equal to 10 %. |
| first_indexed | 2024-03-13T03:04:46Z |
| format | Article |
| id | doaj.art-5d4421eaed834e228f0008b80b862771 |
| institution | Directory Open Access Journal |
| issn | 1813-8225 2541-7541 |
| language | English |
| last_indexed | 2024-03-13T03:04:46Z |
| publishDate | 2023-06-01 |
| publisher | Omsk State Technical University, Federal State Budgetary Educational Institution of Higher Education |
| record_format | Article |
| series | Омский научный вестник |
| spelling | doaj.art-5d4421eaed834e228f0008b80b8627712023-06-27T06:35:52ZengOmsk State Technical University, Federal State Budgetary Educational Institution of Higher EducationОмский научный вестник1813-82252541-75412023-06-012 (186)11912510.25206/1813-8225-2023-186-119-125Devices for express diagnostics of power semiconductor devices and semiconductor convertersE. B. Koroleva0S. M. Kurmashev1K. K. Kim2A. A. Tkachuk3A. A. Kuznetsov4Emperor Alexander I St. Petersburg State Transport UniversityEmperor Alexander I St. Petersburg State Transport UniversityEmperor Alexander I St. Petersburg State Transport UniversityEmperor Alexander I St. Petersburg State Transport UniversityOmsk State Transport UniversityThe increase in the power of power semiconductor converters operated in the railway industry is associated with the use of group connections of power semiconductor devices in them, the variation in the parameters of which, and, therefore, their unequal load, causes a decrease in the reliability of the power semiconductor converters as a whole. In this regard, it becomes necessary to develop and implement innovative methods and devices for express diagnostics in order to identify potentially unreliable semiconductor devices, and the implementation of technical diagnostics should not be associated with dismantling the electrical circuits of the converters. The method is proposed for determining potentially unreliable power semiconductor devices in group connections based on the results of analyzing the distribution of reverse currents in parallel branches, which made it possible to create a series of devices for diagnosing power semiconductor devices in converters, both with and without communication resistors. The methodological error of measurements made using the developed express diagnostics devices of the transducers do not exceed the standard value equal to 10 %.https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2023/%E2%84%962%20(186)%20(%D0%9E%D0%9D%D0%92)/119-125%20%D0%9A%D0%BE%D1%80%D0%BE%D0%BB%D0%B5%D0%B2%D0%B0%20%20%D0%95.%20%D0%91.,%20%D0%9A%D1%83%D1%80%D0%BC%D0%B0%D1%88%D0%B5%D0%B2%20%D0%A1.%20%D0%9C.,%20%20%D0%9A%D0%B8%D0%BC%20%D0%9A.%20%D0%9A.,%20%D0%A2%D0%BA%D0%B0%D1%87%D1%83%D0%BA%20%D0%90.%20%D0%90.,%20%D0%9A%D1%83%D0%B7%D0%BD%D0%B5%D1%86%D0%BE%D0%B2%20%20%D0%90.%20%D0%90..pdfsemiconductor deviceexpress diagnosticsreverse currentcommunication resistorsanalog-to-digital convertermethodical measurement error |
| spellingShingle | E. B. Koroleva S. M. Kurmashev K. K. Kim A. A. Tkachuk A. A. Kuznetsov Devices for express diagnostics of power semiconductor devices and semiconductor converters Омский научный вестник semiconductor device express diagnostics reverse current communication resistors analog-to-digital converter methodical measurement error |
| title | Devices for express diagnostics of power semiconductor devices and semiconductor converters |
| title_full | Devices for express diagnostics of power semiconductor devices and semiconductor converters |
| title_fullStr | Devices for express diagnostics of power semiconductor devices and semiconductor converters |
| title_full_unstemmed | Devices for express diagnostics of power semiconductor devices and semiconductor converters |
| title_short | Devices for express diagnostics of power semiconductor devices and semiconductor converters |
| title_sort | devices for express diagnostics of power semiconductor devices and semiconductor converters |
| topic | semiconductor device express diagnostics reverse current communication resistors analog-to-digital converter methodical measurement error |
| url | https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2023/%E2%84%962%20(186)%20(%D0%9E%D0%9D%D0%92)/119-125%20%D0%9A%D0%BE%D1%80%D0%BE%D0%BB%D0%B5%D0%B2%D0%B0%20%20%D0%95.%20%D0%91.,%20%D0%9A%D1%83%D1%80%D0%BC%D0%B0%D1%88%D0%B5%D0%B2%20%D0%A1.%20%D0%9C.,%20%20%D0%9A%D0%B8%D0%BC%20%D0%9A.%20%D0%9A.,%20%D0%A2%D0%BA%D0%B0%D1%87%D1%83%D0%BA%20%D0%90.%20%D0%90.,%20%D0%9A%D1%83%D0%B7%D0%BD%D0%B5%D1%86%D0%BE%D0%B2%20%20%D0%90.%20%D0%90..pdf |
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