Categorization and SEU Fault Simulations of Radiation-Hardened-by-Design Flip-Flops

Categorization and SEU Fault Simulations of Radiation-Hardened-by-Design Flip-Flops

In the previous three decades, many Radiation-Hardened-by-Design (RHBD) Flip-Flops (FFs) have been designed and improved to be immune to Single Event Upsets (SEUs). Their specifications are enhanced regarding soft error tolerance, area overhead, power consumption, and delay. In this review, previous...

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Bibliographic Details
Main Authors: Ehab A. Hamed, Inhee Lee
Format: Article
Language:English
Published: MDPI AG 2021-06-01
Series:Electronics
Subjects:
dual interlocked storage cell (DICE)
flip-flop (FF)
linear energy transfer (LET)
radiation-hardened-by-design (RHBD)
single event transient (SET)
single event upset (SEU)
Online Access:https://www.mdpi.com/2079-9292/10/13/1572

Internet

https://www.mdpi.com/2079-9292/10/13/1572

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