Categorization and SEU Fault Simulations of Radiation-Hardened-by-Design Flip-Flops
In the previous three decades, many Radiation-Hardened-by-Design (RHBD) Flip-Flops (FFs) have been designed and improved to be immune to Single Event Upsets (SEUs). Their specifications are enhanced regarding soft error tolerance, area overhead, power consumption, and delay. In this review, previous...
Main Authors: | Ehab A. Hamed, Inhee Lee |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2021-06-01
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Series: | Electronics |
Subjects: | |
Online Access: | https://www.mdpi.com/2079-9292/10/13/1572 |
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