Research on Total Ionizing Dose Effect and Reinforcement of SOI-TFET
Since the oxide/source overlap structure can improve the tunneling probability and on-state current of tunneling field effect transistor (TFET) devices, and the silicon-on-insulator (SOI) structure has the effect of resisting the single event effect, SOI-TFET with the oxide/source overlap structure...
Main Authors: | Chen Chong, Hongxia Liu, Shulong Wang, Xiaocong Wu |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2021-10-01
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Series: | Micromachines |
Subjects: | |
Online Access: | https://www.mdpi.com/2072-666X/12/10/1232 |
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