Probabilistic evaluation approach for electrical connector mating: An empirical study on automotive electronic connectors
Half engagement is a state that metal terminals are mated, but mechanical housings are not mated completely. When a connector is in such state, the possibility of connector separation is high even for a small external disturbance. It may cause a serious malfunctioning to the parent product. During m...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
The Japan Society of Mechanical Engineers
2017-12-01
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| Series: | Journal of Advanced Mechanical Design, Systems, and Manufacturing |
| Subjects: | |
| Online Access: | https://www.jstage.jst.go.jp/article/jamdsm/11/5/11_2017jamdsm0064/_pdf/-char/en |
| _version_ | 1811296807063388160 |
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| author | Chunghun HA Hong-Bae JUN Changsoo OK |
| author_facet | Chunghun HA Hong-Bae JUN Changsoo OK |
| author_sort | Chunghun HA |
| collection | DOAJ |
| description | Half engagement is a state that metal terminals are mated, but mechanical housings are not mated completely. When a connector is in such state, the possibility of connector separation is high even for a small external disturbance. It may cause a serious malfunctioning to the parent product. During manufacturing, however, it is difficult to detect the state because electrical functions still work properly. Lack of feeling of mating is known as the primary cause of the state. Normally the feeling of mating is unmeasurable. Therefore, it is necessary to quantify the feeling of mating to prevent the half engagement. To this end, in this paper, we have proposed a new evaluation approach for the half engagement prevention. We have adopted a probabilistic structure based on reliability theory and applied the logistic regression method as a scoring tool. Moreover, we have introduced two new evaluation factors to increase the accuracy of state detection. We have verified and compared the performance of our proposed approach to that of the conventional approach which has a deterministic structure. Throughout extensive experiments and analyses with real automotive electronic connectors, we have confirmed that the proposed approach is superior to the existing one in terms of the accuracy of state detection. |
| first_indexed | 2024-04-13T05:54:54Z |
| format | Article |
| id | doaj.art-5dda334f3f8444d9be4cd1b059608d8f |
| institution | Directory Open Access Journal |
| issn | 1881-3054 |
| language | English |
| last_indexed | 2024-04-13T05:54:54Z |
| publishDate | 2017-12-01 |
| publisher | The Japan Society of Mechanical Engineers |
| record_format | Article |
| series | Journal of Advanced Mechanical Design, Systems, and Manufacturing |
| spelling | doaj.art-5dda334f3f8444d9be4cd1b059608d8f2022-12-22T02:59:39ZengThe Japan Society of Mechanical EngineersJournal of Advanced Mechanical Design, Systems, and Manufacturing1881-30542017-12-01115JAMDSM0064JAMDSM006410.1299/jamdsm.2017jamdsm0064jamdsmProbabilistic evaluation approach for electrical connector mating: An empirical study on automotive electronic connectorsChunghun HA0Hong-Bae JUN1Changsoo OK2Department of Industrial Engineering, Hongik UniversityDepartment of Industrial Engineering, Hongik UniversityDepartment of Industrial Engineering, Hongik UniversityHalf engagement is a state that metal terminals are mated, but mechanical housings are not mated completely. When a connector is in such state, the possibility of connector separation is high even for a small external disturbance. It may cause a serious malfunctioning to the parent product. During manufacturing, however, it is difficult to detect the state because electrical functions still work properly. Lack of feeling of mating is known as the primary cause of the state. Normally the feeling of mating is unmeasurable. Therefore, it is necessary to quantify the feeling of mating to prevent the half engagement. To this end, in this paper, we have proposed a new evaluation approach for the half engagement prevention. We have adopted a probabilistic structure based on reliability theory and applied the logistic regression method as a scoring tool. Moreover, we have introduced two new evaluation factors to increase the accuracy of state detection. We have verified and compared the performance of our proposed approach to that of the conventional approach which has a deterministic structure. Throughout extensive experiments and analyses with real automotive electronic connectors, we have confirmed that the proposed approach is superior to the existing one in terms of the accuracy of state detection.https://www.jstage.jst.go.jp/article/jamdsm/11/5/11_2017jamdsm0064/_pdf/-char/enelectrical connectorhalf engagementreliability structurelogistic regression |
| spellingShingle | Chunghun HA Hong-Bae JUN Changsoo OK Probabilistic evaluation approach for electrical connector mating: An empirical study on automotive electronic connectors Journal of Advanced Mechanical Design, Systems, and Manufacturing electrical connector half engagement reliability structure logistic regression |
| title | Probabilistic evaluation approach for electrical connector mating: An empirical study on automotive electronic connectors |
| title_full | Probabilistic evaluation approach for electrical connector mating: An empirical study on automotive electronic connectors |
| title_fullStr | Probabilistic evaluation approach for electrical connector mating: An empirical study on automotive electronic connectors |
| title_full_unstemmed | Probabilistic evaluation approach for electrical connector mating: An empirical study on automotive electronic connectors |
| title_short | Probabilistic evaluation approach for electrical connector mating: An empirical study on automotive electronic connectors |
| title_sort | probabilistic evaluation approach for electrical connector mating an empirical study on automotive electronic connectors |
| topic | electrical connector half engagement reliability structure logistic regression |
| url | https://www.jstage.jst.go.jp/article/jamdsm/11/5/11_2017jamdsm0064/_pdf/-char/en |
| work_keys_str_mv | AT chunghunha probabilisticevaluationapproachforelectricalconnectormatinganempiricalstudyonautomotiveelectronicconnectors AT hongbaejun probabilisticevaluationapproachforelectricalconnectormatinganempiricalstudyonautomotiveelectronicconnectors AT changsoook probabilisticevaluationapproachforelectricalconnectormatinganempiricalstudyonautomotiveelectronicconnectors |