Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti
A novel X-ray diffraction-based method and computer program X-TEX has been developed to determine the microstructure in individual texture components of polycrystalline, textured materials. Two different approaches are presented. In the first one, based on the texture of the specimen, the X-TEX soft...
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MDPI AG
2020-08-01
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| Series: | Crystals |
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| Online Access: | https://www.mdpi.com/2073-4352/10/8/691 |
| _version_ | 1797559176708227072 |
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| author | Bertalan Jóni Éva Ódor Mia Maric Wolfgang Pantleon Tamás Ungár |
| author_facet | Bertalan Jóni Éva Ódor Mia Maric Wolfgang Pantleon Tamás Ungár |
| author_sort | Bertalan Jóni |
| collection | DOAJ |
| description | A novel X-ray diffraction-based method and computer program X-TEX has been developed to determine the microstructure in individual texture components of polycrystalline, textured materials. Two different approaches are presented. In the first one, based on the texture of the specimen, the X-TEX software provides optimized specimen orientations for X-ray diffraction experiments in which diffraction peaks consist of intensity contributions stemming from grain populations of separate texture components in the specimen. Texture-specific diffraction patterns can be created by putting such peaks together from different measurements into an artificial pattern for each texture component. In the second one, the X-TEX software can determine the intensity contributions of different texture components to diffraction peaks measured in a particular sample orientation. According to this, peaks belonging mainly to one of the present texture components are identified and grouped into the same quasi-phase during the evaluation procedure. The X-TEX method was applied and tested on tensile-deformed, textured, commercially pure titanium samples. The patterns were evaluated by the convolutional multiple whole profile (CMWP) procedure of line profile analysis for dislocation densities, dipole character, slip systems and subgrain size for three different texture components of the Ti specimens. Significant differences were found in the microstructure evolution in the two major and the random texture components. The dislocation densities were discussed by the Taylor model of work hardening. |
| first_indexed | 2024-03-10T17:41:42Z |
| format | Article |
| id | doaj.art-5df3af0f723f431caa0ac4c2b8550512 |
| institution | Directory Open Access Journal |
| issn | 2073-4352 |
| language | English |
| last_indexed | 2024-03-10T17:41:42Z |
| publishDate | 2020-08-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Crystals |
| spelling | doaj.art-5df3af0f723f431caa0ac4c2b85505122023-11-20T09:41:07ZengMDPI AGCrystals2073-43522020-08-0110869110.3390/cryst10080691Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured TiBertalan Jóni0Éva Ódor1Mia Maric2Wolfgang Pantleon3Tamás Ungár4Department of Materials Physics, Eötvös Loránd University Budapest, Pázmány P. sétány 1/A, H-1117 Budapest, HungaryDepartment of Materials Physics, Eötvös Loránd University Budapest, Pázmány P. sétány 1/A, H-1117 Budapest, HungaryMaterials Performance Centre, Department of Materials, The University of Manchester, Manchester M13 9PL, UKSection of Materials and Surface Engineering, Department of Mechanical Engineering, Technical University of Denmark, Produktionstorvet 425, 2800 Kgs. Lyngby, DenmarkDepartment of Materials Physics, Eötvös Loránd University Budapest, Pázmány P. sétány 1/A, H-1117 Budapest, HungaryA novel X-ray diffraction-based method and computer program X-TEX has been developed to determine the microstructure in individual texture components of polycrystalline, textured materials. Two different approaches are presented. In the first one, based on the texture of the specimen, the X-TEX software provides optimized specimen orientations for X-ray diffraction experiments in which diffraction peaks consist of intensity contributions stemming from grain populations of separate texture components in the specimen. Texture-specific diffraction patterns can be created by putting such peaks together from different measurements into an artificial pattern for each texture component. In the second one, the X-TEX software can determine the intensity contributions of different texture components to diffraction peaks measured in a particular sample orientation. According to this, peaks belonging mainly to one of the present texture components are identified and grouped into the same quasi-phase during the evaluation procedure. The X-TEX method was applied and tested on tensile-deformed, textured, commercially pure titanium samples. The patterns were evaluated by the convolutional multiple whole profile (CMWP) procedure of line profile analysis for dislocation densities, dipole character, slip systems and subgrain size for three different texture components of the Ti specimens. Significant differences were found in the microstructure evolution in the two major and the random texture components. The dislocation densities were discussed by the Taylor model of work hardening.https://www.mdpi.com/2073-4352/10/8/691texture componentsX-ray line profile analysistensile-deformed titaniummicrostructuredislocation densityTaylor relation |
| spellingShingle | Bertalan Jóni Éva Ódor Mia Maric Wolfgang Pantleon Tamás Ungár Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti Crystals texture components X-ray line profile analysis tensile-deformed titanium microstructure dislocation density Taylor relation |
| title | Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti |
| title_full | Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti |
| title_fullStr | Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti |
| title_full_unstemmed | Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti |
| title_short | Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti |
| title_sort | microstructure characterization in individual texture components by x ray line profile analysis principles of the x tex method and practical application to tensile deformed textured ti |
| topic | texture components X-ray line profile analysis tensile-deformed titanium microstructure dislocation density Taylor relation |
| url | https://www.mdpi.com/2073-4352/10/8/691 |
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