Processes of Self-Recovery in Film Capacitors in Overload Modes
The advantage of modern metallized film capacitors is high reliability caused by so-called ability to self-recovery. Application of such capacitors in overload modes (at short lifetimes) can significantly improve their technical and volumetric characteristics. In spite of the fact that self-recovery...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Academy of Sciences of Moldova
2017-08-01
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| Series: | Problems of the Regional Energetics |
| Subjects: | |
| Online Access: | http://journal.ie.asm.md/assets/files/02_02_34_2017.pdf |
| _version_ | 1818108036468703232 |
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| author | Belko V.O. Emelyanov O.A. Ivanov I.O. |
| author_facet | Belko V.O. Emelyanov O.A. Ivanov I.O. |
| author_sort | Belko V.O. |
| collection | DOAJ |
| description | The advantage of modern metallized film capacitors is high reliability caused by so-called ability to self-recovery. Application of such capacitors in overload modes (at short lifetimes) can significantly improve their technical and volumetric characteristics. In spite of the fact that self-recovery had been investigated over the last decades, the existing theoretical notions and the reported experimental results did not led to the commonly accepted model of the process of self-recovery. Moreover, there is no information on film capacitors performance in overload modes in the literature. In this paper, we present the results of experimental and theoretical study on processes of self-recovery of film capacitors in overload modes. The capacitors’ testing method is proposed. The method allows to record events of self-recovery over a wide range of voltages and times. It is shown that capacitors are able to operate at voltages 4-6 times higher than nominal value. The capacitors’ degradation mechanism is caused by multiple self-recovery events that lead to the gradual accumulation of highly conducting zones near the breakdown channels. Model of single event of self-recovery is developed. This allows estimating the energy of self-recovery for different levels of applied voltage. It is suggested to use the value of cumulative energy of self-recovery as a parameter for estimating the rate of degradation and predicting the film capacitor’s lifetime. |
| first_indexed | 2024-12-11T02:08:58Z |
| format | Article |
| id | doaj.art-5e2321f0e5ed4d4e8b1cabbfbfee9b6f |
| institution | Directory Open Access Journal |
| issn | 1857-0070 |
| language | English |
| last_indexed | 2024-12-11T02:08:58Z |
| publishDate | 2017-08-01 |
| publisher | Academy of Sciences of Moldova |
| record_format | Article |
| series | Problems of the Regional Energetics |
| spelling | doaj.art-5e2321f0e5ed4d4e8b1cabbfbfee9b6f2022-12-22T01:24:19ZengAcademy of Sciences of MoldovaProblems of the Regional Energetics1857-00702017-08-013421322Processes of Self-Recovery in Film Capacitors in Overload ModesBelko V.O.0Emelyanov O.A.1Ivanov I.O.2Peter the Great St. Petersburg Polytechnic University St. Petersburg, Russian FederationPeter the Great St. Petersburg Polytechnic University St. Petersburg, Russian FederationPeter the Great St. Petersburg Polytechnic University St. Petersburg, Russian FederationThe advantage of modern metallized film capacitors is high reliability caused by so-called ability to self-recovery. Application of such capacitors in overload modes (at short lifetimes) can significantly improve their technical and volumetric characteristics. In spite of the fact that self-recovery had been investigated over the last decades, the existing theoretical notions and the reported experimental results did not led to the commonly accepted model of the process of self-recovery. Moreover, there is no information on film capacitors performance in overload modes in the literature. In this paper, we present the results of experimental and theoretical study on processes of self-recovery of film capacitors in overload modes. The capacitors’ testing method is proposed. The method allows to record events of self-recovery over a wide range of voltages and times. It is shown that capacitors are able to operate at voltages 4-6 times higher than nominal value. The capacitors’ degradation mechanism is caused by multiple self-recovery events that lead to the gradual accumulation of highly conducting zones near the breakdown channels. Model of single event of self-recovery is developed. This allows estimating the energy of self-recovery for different levels of applied voltage. It is suggested to use the value of cumulative energy of self-recovery as a parameter for estimating the rate of degradation and predicting the film capacitor’s lifetime.http://journal.ie.asm.md/assets/files/02_02_34_2017.pdfelectrical capacitors |
| spellingShingle | Belko V.O. Emelyanov O.A. Ivanov I.O. Processes of Self-Recovery in Film Capacitors in Overload Modes Problems of the Regional Energetics electrical capacitors |
| title | Processes of Self-Recovery in Film Capacitors in Overload Modes |
| title_full | Processes of Self-Recovery in Film Capacitors in Overload Modes |
| title_fullStr | Processes of Self-Recovery in Film Capacitors in Overload Modes |
| title_full_unstemmed | Processes of Self-Recovery in Film Capacitors in Overload Modes |
| title_short | Processes of Self-Recovery in Film Capacitors in Overload Modes |
| title_sort | processes of self recovery in film capacitors in overload modes |
| topic | electrical capacitors |
| url | http://journal.ie.asm.md/assets/files/02_02_34_2017.pdf |
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