Low-Quality Integrated Circuits Image Verification Based on Low-Rank Subspace Clustering with High-Frequency Texture Components
With the vigorous development of integrated circuit (IC) manufacturing, the harmfulness of defects and hardware Trojans is also rising. Therefore, chip verification becomes more and more important. At present, the accuracy of most existing chip verification methods depends on high-precision sample d...
Main Authors: | Guoliang Tan, Zexiao Liang, Yuan Chi, Qian Li, Bin Peng, Yuan Liu, Jianzhong Li |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-12-01
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Series: | Applied Sciences |
Subjects: | |
Online Access: | https://www.mdpi.com/2076-3417/13/1/155 |
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