Electromagnetic Behavior of Cu and Ni Nanofilms in the X-band
Currently, the presence of spurious microwave radiation is increasing in the environment, which has caused concern due to possible health problems in living beings and electromagnetic interference in electronic systems. To control this problem, studies in the materials area are taking place, aiming...
| Main Authors: | , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Instituto de Aeronáutica e Espaço (IAE)
2023-06-01
|
| Series: | Journal of Aerospace Technology and Management |
| Subjects: | |
| Online Access: | https://jatm.com.br/jatm/article/view/1301 |
| _version_ | 1827915439030665216 |
|---|---|
| author | Vitor Fernando de Melo Gonçalves Erick Gabriel Ribeiro dos Anjos Guilherme Ferreira de Melo Morgado Tayra Rodrigues Brazil Maurício Ribeiro Baldan Maria Aparecida Miranda de Souza Evandro Luís Nohara Mirabel Cerqueira Rezende |
| author_facet | Vitor Fernando de Melo Gonçalves Erick Gabriel Ribeiro dos Anjos Guilherme Ferreira de Melo Morgado Tayra Rodrigues Brazil Maurício Ribeiro Baldan Maria Aparecida Miranda de Souza Evandro Luís Nohara Mirabel Cerqueira Rezende |
| author_sort | Vitor Fernando de Melo Gonçalves |
| collection | DOAJ |
| description |
Currently, the presence of spurious microwave radiation is increasing in the environment, which has caused concern due to possible health problems in living beings and electromagnetic interference in electronic systems. To control this problem, studies in the materials area are taking place, aiming to attenuate the spurious radiation and meet requirements of good performance in broadband, low cost and low weight. The present work aimed to study Cu and Ni nanometric films with thicknesses of 65 and 200 nm, deposited on polyethylene terephthalate substrate by magnetron sputtering. Scanning electron microscopy with a field emission gun (FEGSEM) showed that the films produced have different morphological textures, due to the parameters used in the sputtering process and also the free energy of metals. Impedance spectroscopy measurements showed that the films have low conductivity values, due to the metallic oxides formed on the film surfaces, confirmed by X-ray diffraction, and also to the presence of defects. Electromagnetic characterization (8.2 – 12.4 GHz) showed that the Cu and Ni thin films had low performance, except the Ni_200 nm film, which showed a total shielding efficiency of about 30% in broadband. This result is promising considering the nanometric thickness of the Ni film.
|
| first_indexed | 2024-03-13T02:59:38Z |
| format | Article |
| id | doaj.art-5e46311161f04bd18d3f3163b64caeb4 |
| institution | Directory Open Access Journal |
| issn | 2175-9146 |
| language | English |
| last_indexed | 2024-03-13T02:59:38Z |
| publishDate | 2023-06-01 |
| publisher | Instituto de Aeronáutica e Espaço (IAE) |
| record_format | Article |
| series | Journal of Aerospace Technology and Management |
| spelling | doaj.art-5e46311161f04bd18d3f3163b64caeb42023-06-27T15:23:46ZengInstituto de Aeronáutica e Espaço (IAE)Journal of Aerospace Technology and Management2175-91462023-06-0115Electromagnetic Behavior of Cu and Ni Nanofilms in the X-bandVitor Fernando de Melo Gonçalves0Erick Gabriel Ribeiro dos Anjos1Guilherme Ferreira de Melo Morgado2Tayra Rodrigues Brazil3Maurício Ribeiro Baldan4Maria Aparecida Miranda de Souza5Evandro Luís Nohara6Mirabel Cerqueira Rezende7Universidade Federal de São Paulo – Instituto de Ciência e Tecnologia – Laboratório de Tecnologia de Polímeros e Biopolímeros – São José dos Campos/SP – Brazil.Universidade Federal de São Paulo – Instituto de Ciência e Tecnologia – Laboratório de Tecnologia de Polímeros e Biopolímeros –– São José dos Campos/SP – Brazil.Universidade Federal de São Paulo – Instituto de Ciência e Tecnologia – Laboratório de Tecnologia de Polímeros e Biopolímeros – São José dos Campos/SP – Brazil.Universidade Federal de São Paulo – Instituto de Ciência e Tecnologia – Laboratório de Tecnologia de Polímeros e Biopolímeros – São José dos Campos/SP – Brazil.Instituto Nacional de Pesquisas Espaciais – Laboratório Associado de Sensores e Materiais – São José dos Campos/SP – Brazil.Departamento de Ciência e Tecnologia Aeroespacial – Instituto de Aeronáutica e Espaço – Divisão de Materiais – São José dos Campos/SP – Brazil.Universidade de Taubaté – Departamento de Engenharia Mecânica – Taubaté/SP – Brazil.Universidade Federal de São Paulo – Instituto de Ciência e Tecnologia – Laboratório de Tecnologia de Polímeros e Biopolímeros – São José dos Campos/SP – Brazil. Currently, the presence of spurious microwave radiation is increasing in the environment, which has caused concern due to possible health problems in living beings and electromagnetic interference in electronic systems. To control this problem, studies in the materials area are taking place, aiming to attenuate the spurious radiation and meet requirements of good performance in broadband, low cost and low weight. The present work aimed to study Cu and Ni nanometric films with thicknesses of 65 and 200 nm, deposited on polyethylene terephthalate substrate by magnetron sputtering. Scanning electron microscopy with a field emission gun (FEGSEM) showed that the films produced have different morphological textures, due to the parameters used in the sputtering process and also the free energy of metals. Impedance spectroscopy measurements showed that the films have low conductivity values, due to the metallic oxides formed on the film surfaces, confirmed by X-ray diffraction, and also to the presence of defects. Electromagnetic characterization (8.2 – 12.4 GHz) showed that the Cu and Ni thin films had low performance, except the Ni_200 nm film, which showed a total shielding efficiency of about 30% in broadband. This result is promising considering the nanometric thickness of the Ni film. https://jatm.com.br/jatm/article/view/1301Electromagnetic shielding Energy absorption filmsThin filmsNickel coatingsCopperMagnetron sputtering |
| spellingShingle | Vitor Fernando de Melo Gonçalves Erick Gabriel Ribeiro dos Anjos Guilherme Ferreira de Melo Morgado Tayra Rodrigues Brazil Maurício Ribeiro Baldan Maria Aparecida Miranda de Souza Evandro Luís Nohara Mirabel Cerqueira Rezende Electromagnetic Behavior of Cu and Ni Nanofilms in the X-band Journal of Aerospace Technology and Management Electromagnetic shielding Energy absorption films Thin films Nickel coatings Copper Magnetron sputtering |
| title | Electromagnetic Behavior of Cu and Ni Nanofilms in the X-band |
| title_full | Electromagnetic Behavior of Cu and Ni Nanofilms in the X-band |
| title_fullStr | Electromagnetic Behavior of Cu and Ni Nanofilms in the X-band |
| title_full_unstemmed | Electromagnetic Behavior of Cu and Ni Nanofilms in the X-band |
| title_short | Electromagnetic Behavior of Cu and Ni Nanofilms in the X-band |
| title_sort | electromagnetic behavior of cu and ni nanofilms in the x band |
| topic | Electromagnetic shielding Energy absorption films Thin films Nickel coatings Copper Magnetron sputtering |
| url | https://jatm.com.br/jatm/article/view/1301 |
| work_keys_str_mv | AT vitorfernandodemelogoncalves electromagneticbehaviorofcuandninanofilmsinthexband AT erickgabrielribeirodosanjos electromagneticbehaviorofcuandninanofilmsinthexband AT guilhermeferreirademelomorgado electromagneticbehaviorofcuandninanofilmsinthexband AT tayrarodriguesbrazil electromagneticbehaviorofcuandninanofilmsinthexband AT mauricioribeirobaldan electromagneticbehaviorofcuandninanofilmsinthexband AT mariaaparecidamirandadesouza electromagneticbehaviorofcuandninanofilmsinthexband AT evandroluisnohara electromagneticbehaviorofcuandninanofilmsinthexband AT mirabelcerqueirarezende electromagneticbehaviorofcuandninanofilmsinthexband |