| Summary: | Structured light illumination is widely applied for surface defect detection due to its advantages in terms of speed, precision, and non-contact capabilities. However, the high reflectivity of metal surfaces often results in the loss of point clouds, thus reducing the measurement accuracy. In this paper, we propose a novel quaternary categorization strategy to address the high-reflectivity issue. Firstly, we classify the pixels into four types according to the phase map characteristics. Secondly, we apply tailored optimization and reconstruction strategies to each type of pixel. Finally, we fuse point clouds from multi-type pixels to accomplish precise measurements of high-reflectivity surfaces. Experimental results show that our strategy effectively reduces the high-reflectivity error when measuring metal surfaces and exhibits stronger robustness against noise compared to the conventional method.
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